Optoelectronic Sensor Memory Test Method
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Solution Overview
Problem
Laser scanners, particularly those used in safety-critical applications, face challenges in ensuring the reliability and integrity of measurement data processing due to the complexity and computational intensity of existing security mechanisms like CRC, and the lack of effective memory testing methods, which can lead to undetected memory errors and safety failures.
Innovation Solution
An optoelectronic sensor with a memory test method that replaces measurement data with test data within the processing chain, allowing for reliable detection of memory errors without significant computational effort, by using test patterns that mimic measurement data and ensuring the processing chain remains unchanged, thus enabling easy retrofitting and compliance with safety standards.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If CRC (Cyclic Redundancy Check) is used for data security, then data transmission reliability is improved, but computational effort and system complexity increase significantly
Solution Approach 1:
The patent extracts the memory testing function from the main measurement data processing flow by introducing a separate test data path. Test patterns are generated and processed independently from real measurement data, allowing memory testing without interfering with normal operation. This separation reduces the complexity burden of comprehensive security checks while maintaining reliability through dedicated test sequences.
Solution Approach 2:
The patent changes the data parameter state by introducing known test patterns (specific bit sequences) into the memory system. By injecting these predetermined test values and comparing the output against expected results, the system can detect memory errors without requiring complex computational checks like CRC on all data. The parameter change from arbitrary measurement data to structured test patterns simplifies the verification process.
2Reliability
If memory testing is implemented using conventional methods (writing test patterns and reading back), then memory error detection capability is improved, but test cycle time and computational effort increase
Solution Approach 1:
The patent implements periodic memory testing by cyclically introducing test patterns at regular intervals within the measurement data stream. Instead of performing comprehensive memory tests only during dedicated test periods, the system continuously interleaves test data with measurement data, enabling ongoing memory verification without stopping normal operations. This periodic approach reduces the perceived test cycle time while maintaining detection capability.
Solution Approach 2:
The patent maintains continuous useful action by processing both measurement data and test data through the same signal processing chain simultaneously. The memory testing does not interrupt or pause the measurement function; instead, test patterns flow continuously through the system alongside real data, allowing memory verification to occur without breaking the operational continuity of the laser scanner.
3Reliability
If test data is introduced into the measurement data processing chain, then memory function testing is improved, but data processing accuracy may be affected
Solution Approach 1:
The patent segments the data processing chain into distinct measurement data paths and test data paths. By separating the processing flows, the system can apply different evaluation criteria to each type of data. Test data results are evaluated specifically for memory function verification, while measurement data maintains its dedicated accuracy evaluation path. This segmentation prevents test data from contaminating measurement precision assessments.
Solution Approach 2:
The patent introduces an intermediary evaluation stage that distinguishes between test data results and measurement data results. The system uses metadata or identification markers to recognize test patterns and routes them through appropriate evaluation logic that understands they are test sequences rather than real measurements. This intermediary layer ensures test data serves its diagnostic purpose without compromising the accuracy assessment of actual measurement data.
Data Source
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AI summary
An optoelectronic sensor (10) is described, comprising at least one measurement data storage device (48) for storing measurement data and a controller (36) configured for a functional test of the measurement data storage device. The controller (36, 52a) is further configured to periodically replace measurement data with test data during the functional test and to discard the measurement data in the process.