Optoelectronic Surveillance Device Self-Test via Integration Time Control

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Solution Overview

Problem

Existing optoelectronic monitoring devices face challenges in conducting a reliable and efficient functional test for image sensors without requiring additional components or interrupting ongoing operations, as existing methods are complex and often necessitate external scene manipulation or mechanical actuators.

Innovation Solution

A monitoring device that integrates a test method into the normal evaluation sequence using varying control parameters and time sequences to adjust the integration time window, allowing for a functional test of image sensors without mechanical actuators or separate test devices, by either lengthening or shortening the integration time window or shifting the flash time window relative to the integration time window.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If additional test devices or mechanical actuators are used to test the image sensor, then the reliability of the test is improved, but the device complexity increases

Engineering Contradiction:
Improvetest reliabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The controller is designed to perform both normal monitoring operations and sensor functionality tests using the same hardware components. By making the controller universal, the patent eliminates the need for separate test devices while maintaining test reliability through software-controlled integration of existing components.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The monitoring device tests its own image sensor using its existing components (controller, light source, integration time control) without requiring external test equipment. The system performs self-diagnosis by controlling the integration time window and evaluating sensor responses, thereby eliminating additional hardware while ensuring reliable testing.

Inventive Principle:
Principle #25Self-service

2Reliability

If separate test cycles are implemented to test the image sensor, then the test thoroughness is improved, but the productivity decreases

Engineering Contradiction:
Improvetest thoroughnessVSAvoidoperational efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent combines the sensor functionality test with the normal monitoring operation by integrating both functions into the same evaluation sequence. The controller performs monitoring and testing simultaneously using the same hardware and processing pipeline, eliminating separate test cycles while maintaining thorough sensor evaluation through integration time variation.

Inventive Principle:
Principle #5Merging (Combining)

3Device complexity

If the integration time window is varied to test the sensor, then the test simplicity is improved, but the measurement precision may be affected

Engineering Contradiction:
Improvetest simplicityVSAvoidsensor measurement precision
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent changes the integration time window parameter to stimulate the sensor during testing. By systematically varying this temporal parameter and comparing sensor responses at different integration times, the system achieves simple test implementation while maintaining measurement precision through controlled parameter variation and comparative evaluation.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables a simple, reliable, and non-intrusive functional test of image sensors, allowing for parallel execution of monitoring and testing tasks without additional components, ensuring sensor functionality without disrupting normal operations.

Implementation Method 1

A camera 20 evaluates light incident from a scene... A light receiver 23, in particular a CCD or CMOS sensor, evaluates the light incident on it

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Implementation Method 2

The test unit is preferably designed to lengthen or shorten the integration time window. This leads directly to a change in the brightness signal without changing the external scene

Methodology Applied
Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentEP1921587B1Optoelectronic surveillance device with a test unit and test method
Publication Date: 2008.12.17 SICK AG
  • EP1921587B1 patent drawingFigure 1~2
  • EP1921587B1 patent drawingFigure 3~4

AI summary

The device has a light receiver designed to receive light within an integration time window (70) and to emit a resulting luminance signal, where the light receiver is provided as a charge coupled device (CCD) or complementary metal oxide semiconductor-sensor. A control of the monitoring device is designed to verify the operability of the light receiver. The control is designed to vary the integration time window and to compare the change of the luminance signal with an expected change of the luminance signal. An independent claim is also included for a test method for an opto-electronic monitoring device.