Optoelectronic Device Testing Apparatus with Segmented Thermal Control

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Solution Overview

Problem

Existing testing apparatuses for optoelectronic devices face inefficiencies in temperature control, leading to prolonged heating times and target degradation, resulting in inaccurate data due to dimensional and chemical changes at elevated temperatures.

Innovation Solution

The apparatus includes an optoelectronic device stage with a cavity, electrical contacts, a temperature sensing device, and a thermal-adjustment device, such as a thermoelectric or thermal heating element, to facilitate rapid temperature changes and minimize target degradation by isolating the optoelectronic device and target within a gas-tight seal.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Temperature

If the entire testing apparatus is heated to elevated temperatures, then the optoelectronic device can be tested at multiple temperatures, but the heating time becomes substantial and productivity decreases

Engineering Contradiction:

Improvetesting temperatureVSAvoidheating speed

Core Design Contradiction:

TemperatureVSProductivity

Solution Approach 1:

The patent divides the heating system into separate zones: a first heating element for the optoelectronic device stage and a second heating element for the target stage. This segmentation allows independent temperature control and rapid heating of each component without requiring the entire apparatus to be heated, thereby reducing heating time and improving productivity.

Inventive Principle:

Principle #1Segmentation

2Temperature

If the entire testing apparatus is heated to elevated temperatures, then the optoelectronic device can be tested at multiple temperatures, but the time required to reach desired temperature increases

Engineering Contradiction:

Improvetesting temperatureVSAvoidheating time

Core Design Contradiction:

TemperatureVSLoss of time

Solution Approach 1:

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent implements preliminary heating of the optoelectronic device and target separately before testing begins. The heating elements can pre-heat components to desired temperatures in advance, reducing the time required to reach testing conditions and minimizing delays in the testing process.

Inventive Principle:

Principle #10Preliminary action

3Temperature

If the target is heated to elevated temperatures, then the optoelectronic device can be tested at multiple temperatures, but the target exhibits dimensional changes and chemical changes leading to measurement inaccuracy

Engineering Contradiction:

Improvetesting temperatureVSAvoidtest data accuracy

Core Design Contradiction:

TemperatureVSMeasurement precision

Solution Approach 1:

The patent divides the heating system into separate zones: a first heating element for the optoelectronic device stage and a second heating element for the target stage. This segmentation allows independent temperature control, enabling the target to be heated only when necessary and for shorter durations, thereby reducing thermal degradation and maintaining measurement precision.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The patent implements rapid heating and cooling cycles that change temperature parameters quickly and precisely. By controlling the duration and intensity of heating, the system achieves necessary temperature variations for testing while minimizing the time the target is exposed to elevated temperatures, thus preventing dimensional and chemical changes that would compromise measurement accuracy.

Inventive Principle:

Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid optical performance measurements at multiple temperatures with reduced target degradation, minimizing spurious data collection by precise temperature control and maintaining the integrity of the test target.

Implementation Method 1

The thermal-adjustment device is a thermoelectric device

Methodology Applied

Scientific EffectThermoelectric effect: Peltier Effect

Implementation Method 2

The temperature sensing device can be positioned within the stage proximal to the cavity and the optoelectronic device

Methodology Applied

Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 3

at least one spring fixedly connected to the optoelectronic device stage and a base. The spring(s) can be operable to bring the base and the optoelectronic device stage in thermal and mechanical communication

Methodology Applied

Scientific EffectElasticity: Elasticity

Data Source

PatentEP3568706B1Apparatus for testing an optoelectronic device and method of operating the same

Publication Date: 2023.05.10 AMS OSRAM ASIA PACIFIC PTE LTD

Figure 1A~1B
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Figure 3

AI summary

Testing apparatus operable to collect optical performance data of optoelectronic devices at different temperatures includes thermal-adjustment devices in thermal and mechanical contact with the optoelectronic devices via optoelectronic device stages. The thermal-adjustment devices can direct thermal energy to the optoelectronic devices under test without heating test targets in close proximity. Consequently, in some instances, spurious results can be avoided and rapid measurement of the optoelectronic devices different temperatures can be achieved.