Optronic System Calibration via Inertial Reference and Image Tracking
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Solution Overview
Problem
Conventional calibration procedures for optronic systems in motion are costly, laborious, and difficult to perform, especially on mobile platforms, due to mechanical and thermal deformations, and require external data and complex setups, which limits their precision and autonomy.
Innovation Solution
A method for calibrating measurement instruments in an optronic system that involves acquiring images of a fixed object from multiple positions, synchronizing distance and angle measurements, and estimating measurement defects to minimize dispersion, allowing for autonomous, in-situ calibration without external information or human intervention.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional calibration procedures are used to align measurement instruments with the reference system, then the positioning accuracy is improved, but the calibration process becomes costly, laborious, and difficult to perform
Solution Approach 1:
The system performs autonomous calibration using an inertial reference system and processor that automatically computes correction parameters without human intervention. The measurement instruments self-calibrate by comparing their readings against the inertial reference frame and adjusting their coordinate transformations autonomously
Solution Approach 2:
The patent replaces complex mechanical alignment procedures with computational methods. Instead of physically adjusting and manually aligning instruments, the system uses software-based coordinate frame transformations and correction parameters derived from inertial measurements to achieve precise positioning
2Measurement precision
If conventional calibration procedures are used with complex setups and external data, then the alignment precision is improved, but the procedure complexity increases
Solution Approach 1:
The patent extracts the essential calibration function by using only the inertial reference system and the processor. External calibration equipment, multiple reference instruments, and complex alignment tools are removed, leaving a minimal setup that relies on the inertial platform's inherent stability and the computational algorithm
Solution Approach 2:
The inertial reference system serves multiple functions: it provides the reference coordinate frame, enables autonomous calibration, and continuously monitors positioning accuracy. The processor also performs both calibration computations and positioning calculations, eliminating the need for separate dedicated calibration equipment
3Measurement precision
If conventional calibration procedures are used requiring external information, then the measurement accuracy is improved, but the autonomy of the system decreases
Solution Approach 1:
The system is completely self-sufficient for calibration purposes. The inertial reference system and processor work together to autonomously determine correction parameters without requiring any external information, equipment, or human intervention, achieving both high accuracy and full autonomy
Data Source
AI summary
A method for calibrating measurement instruments of an optronic system in motion, with positions P1, P2, . . . , Pi, . . . , comprises: a device for acquiring images of a scene comprising a fixed object G0; and means for tracking the fixed object G0 during the acquisition of these images; means for obtaining the positions P1, P2, . . . ; at least one instrument for measuring the distance and/or an instrument for measuring angles of orientation and/or of attitude between this measurement instrument and the fixed object G0, according to a line of sight LoS. It comprises the following steps: acquisition at instants t1, t2, . . . of at least two images, each image being acquired on the basis of different positions P1, P2, . . . of the system, the fixed object G0 being sighted in each image, but its position being unknown; acquisition at the instants t′1, t′2, . . . of measurements of distance and/or of angle; synchronization of the measurements of distance and/or of angle with the positions P1, P2, . . . established at instants t1, t2, . . . ; estimation of the measurement defects which minimize the dispersion of at least two points of intersection Gij between the LoS at the position Pi and the LoS at the position Pj, as a function of said measurements and of the known positions Pi, Pj of the system.