Ordinal Classification of Microscope Images via Binary Classifier Scores

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Solution Overview

Problem

Existing microscopy systems face challenges in accurately classifying microscope images using binary classifiers, which lose class order information, leading to increased misclassification errors, especially when distinguishing between ordered classes like image quality levels.

Innovation Solution

A computer-implemented method for ordinal classification using a machine-learned model that combines estimates from multiple binary classifiers to form a total score, allowing for classification based on variably definable threshold values and interval limits of different widths, thereby preserving class order and improving precision and flexibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple binary classifiers are used to discriminate a larger number of potential classes, then the classification coverage is improved, but the class order information is lost leading to increased misclassification errors

Engineering Contradiction:
Improveclassification coverageVSAvoidmisclassification error rate
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent segments the ordinal classification problem into multiple binary classification sub-problems. Instead of using a single complex classifier, it divides the task into several binary classifiers, each handling a specific threshold comparison. This segmentation allows the system to maintain class order information while achieving comprehensive multi-class discrimination, thereby resolving the contradiction between classification coverage and misclassification error rate.

Inventive Principle:
Principle #1Segmentation

2Ease of manufacture

If binary classifiers are trained for each class independently, then the training process is simplified, but the class order relationship is ignored reducing classification precision

Engineering Contradiction:
Improvetraining process simplicityVSAvoidclassification precision
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent introduces dynamic threshold values that can be adjusted based on the ordinal relationship between classes. The binary classifiers are trained with dynamic thresholds that reflect the ordered nature of the classes, allowing the system to maintain training simplicity while improving classification precision through adaptive threshold adjustment that captures class order information.

Inventive Principle:
Principle #15Dynamics

3Ease of operation

If fixed threshold values are used for classification, then the classification process is straightforward, but the system lacks flexibility for different applications

Engineering Contradiction:
Improveclassification process simplicityVSAvoidapplication flexibility
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The patent performs preliminary action by pre-training the binary classifiers with ordinal relationship information embedded in the training data. The classifiers are pre-adapted to understand the ordered structure of classes through training on labeled data that reflects the ordinal relationships. This preliminary adaptation enables the system to maintain simple operation during inference while achieving high flexibility for different applications through the learned ordinal structure.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20230105854A1Method for the Ordinal Classification of a Microscope Image and Microscopy System
Publication Date: 2023.04.06 CARL ZEISS MICROSCOPY GMBH
  • US20230105854A1 patent drawing
  • US20230105854A1 patent drawing
  • US20230105854A1 patent drawing

AI summary

A computer-implemented method for the ordinal classification of at least one microscope image calculates a classification into one of a plurality of classes which form an order with respect to an image property. The microscope image is input into a machine-learned model for ordinal classification. The model comprises binary classifiers which calculate estimates regarding whether the microscope image belongs to cumulative auxiliary classes, which combine different numbers of the classes which follow each other in the order. The estimates can be combined so as to form a total score, wherein the classification occurs by comparing the total score with threshold values which can be defined in a variable manner depending on the application, or interval limits of the classes can be defined so that the classes form intervals of different widths. The model for ordinal classification can also comprise further binary classifiers for inverse auxiliary classes.