Organic EL Device Defect Repair via Adaptive Laser Irradiation
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Solution Overview
Problem
Existing methods for repairing defects in organic electroluminescence (EL) devices through laser irradiation are inefficient in controlling irradiation conditions, leading to damage to non-target areas and lack of convenience and adaptability.
Innovation Solution
A method involving preliminary laser irradiation to determine optimal conditions for secondary laser irradiation, where the laser is emitted in a closed line around the shorted area to increase resistance, allowing for accurate and stable repair without reducing the light-emitting surface area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If laser irradiation is used to repair short circuit defects in organic EL devices, then the resistance in the target region can be increased to resolve the short circuit, but damage to areas other than the target region may occur due to improper control of irradiation conditions
Solution Approach 1:
The patent performs preliminary laser irradiation to create an irradiation mark before the actual repair irradiation. This preliminary action allows observation and measurement of the irradiation effect, enabling determination of optimal irradiation conditions for the subsequent repair process, thereby preventing damage to non-target areas.
Solution Approach 2:
The patent implements a feedback mechanism by observing the state of the irradiation mark formed during preliminary irradiation, measuring its depth, and using this information to adjust and determine the irradiation conditions for the actual repair process. This closed-loop control ensures precise irradiation and prevents damage to surrounding areas.
2Measurement precision
If complex measuring devices are used to measure the depth of laser irradiation marks, then measurement precision can be improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent creates an irradiation mark as a copy or indicator of the laser irradiation effect, which can then be observed and measured. This indirect measurement approach through the irradiation mark simplifies the measuring device requirements while maintaining sufficient measurement precision for process control.
Solution Approach 2:
The irradiation mark serves as a temporary, disposable indicator that is created during the process and then used for measurement. This eliminates the need for complex, expensive measurement equipment by using a simple visual or optical marker that can be easily observed and measured with basic devices.
3Ease of manufacture
If fixed laser irradiation conditions are used for all defect sizes, then the manufacturing process can be simplified, but adaptability to different defect sizes and types is reduced
Solution Approach 1:
The patent transforms the irradiation process from a static, fixed-condition process to a dynamic, adaptive process. By using preliminary irradiation to create an observable mark and measuring its characteristics, the system dynamically determines the appropriate irradiation conditions for each specific defect, enabling adaptability while maintaining process simplicity through automation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables reliable and stable repair of defects by accurately determining and applying laser irradiation conditions, minimizing damage to non-target areas and maintaining light-emitting capability.
Implementation Method 1
irradiating a light-emitting region of the organic EL device with a laser beam under a first irradiation condition
Implementation Method 2
observing a state of an irradiation mark formed in the light-emitting region through the irradiation with the laser beam
Data Source
AI summary
A method of manufacturing an organic EL device includes: irradiating a light-emitting region of the organic EL device which includes a defective portion with a laser beam under a first irradiation condition; observing a state of an irradiation mark formed in the light-emitting region through the irradiation with the laser beam in the irradiating under a first irradiation condition; determining a second irradiation condition for resolving a defect caused by the defective portion, based on the first irradiation condition and the observed state of the irradiation mark; and irradiating the light-emitting region with a laser beam under the second irradiation condition determined in the determining of a second irradiation condition.


