Organic EL Device Manufacturing Nitrogen Oxide Exposure Control

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Solution Overview

Problem

The organic electroluminescent (EL) devices produced by existing methods have insufficient luminance life.

Innovation Solution

A production method for organic EL devices that involves specific exposure conditions to nitrogen oxides, sulfur oxides, and ammonia, including controlled concentrations and exposure times during the formation of organic functional layers and sealing layers, along with a calcination stage to enhance the light emission life.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Duration of action of stationary object

If existing production methods are used with standard exposure conditions, then the production process is simple, but the luminance life of the organic EL device is insufficient

Engineering Contradiction:
Improveluminance lifeVSAvoidproduction process complexity
Core Design Contradiction:
Duration of action of stationary objectVSDevice complexity

Solution Approach 1:

The patent applies parameter changes by precisely controlling the exposure time to nitrogen oxides (maintaining at 10 minutes or less) and sulfur oxides (maintaining at 5 minutes or less) during the formation of organic functional layers. By optimizing these exposure parameters within specific ranges, the invention achieves extended luminance life without substantially complicating the production process, resolving the contradiction between device durability and manufacturing simplicity.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements preliminary action by performing controlled exposure to nitrogen oxides and sulfur oxides during the film formation stage before subsequent processing steps. This preliminary exposure treatment prepares the organic functional layer for enhanced stability and longevity, ensuring improved luminance life is achieved from the outset rather than requiring complex post-processing modifications.

Inventive Principle:
Principle #10Preliminary action

2Manufacturing precision

If the exposure time to nitrogen oxides and sulfur oxides is extended, then the organic functional layer formation is more complete, but the luminance life decreases due to excessive exposure

Engineering Contradiction:
Improveorganic functional layer formation qualityVSAvoidluminance life
Core Design Contradiction:
Manufacturing precisionVSDuration of action of stationary object

Solution Approach 1:

The patent applies parameter changes by establishing specific exposure time thresholds (10 minutes or less for nitrogen oxides, 5 minutes or less for sulfur oxides) during organic functional layer formation. This precise parameter control ensures sufficient layer formation quality while preventing excessive exposure that would degrade luminance life, thereby resolving the contradiction between manufacturing precision and device durability.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements feedback control by monitoring and adjusting the exposure time to nitrogen oxides and sulfur oxides based on their concentrations in the atmosphere. This feedback mechanism ensures that the exposure remains within the optimal range to achieve complete organic functional layer formation without exceeding the threshold that would harm luminance life.

Inventive Principle:
Principle #23Feedback

Data Source

PatentEP3310134B1Method of manufacturing organic el element
Publication Date: 2019.07.24 SUMITOMO CHEM CO LTD
  • EP3310134B1 patent drawingFigure 1~2
  • EP3310134B1 patent drawing
  • EP3310134B1 patent drawing

AI summary

A method for producing an organic EL device having an anode, a cathode, at least one organic functional layer disposed between the anode and the cathode, and a sealing layer, comprising a step of forming the anode, a step of forming the cathode, a step of forming the at least one organic functional layer and a step of forming the sealing layer, wherein the average concentration: A (ppm) of a nitrogen oxide to which the organic EL device during production is exposed from initiation time of the step of forming the at least one organic functional layer until termination time of the step of forming the sealing layer and the exposure time thereof: B (sec) satisfy the formula (1-1): 0≤A×B<12