Organic Imaging Element With Oxide Interlayer for Faster Charge Transfer

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Solution Overview

Problem

Current stacked imaging elements face challenges in efficiently transferring signal charge from the photoelectric conversion layer to the FD electrode without delay, which affects the quality of captured images.

Innovation Solution

The proposed imaging element incorporates an inorganic oxide semiconductor material layer with a specific composition (MaNbSncO) between the first electrode and the photoelectric conversion layer, enhancing charge transfer efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If an inorganic oxide semiconductor material layer with specific composition is introduced between the first electrode and the photoelectric conversion layer, then charge transfer efficiency is improved and signal delay is reduced, but device structure becomes more complex

Engineering Contradiction:
Improvecharge transfer speedVSAvoiddevice structure complexity
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The patent introduces an inorganic oxide semiconductor material layer as an intermediary component between the first electrode and the photoelectric conversion layer. This intermediate layer facilitates efficient charge transfer by providing optimal energy level alignment and charge carrier mobility, thereby reducing signal delay without requiring fundamental changes to the overall device architecture.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs composite material structure by combining organic photoelectric conversion layer with inorganic oxide semiconductor material layer. This composite approach leverages the advantages of both material types: the organic material provides excellent photoelectric conversion properties while the inorganic oxide semiconductor layer ensures efficient charge transfer, achieving superior overall performance.

Inventive Principle:
Principle #40Composite materials

2Device complexity

If a simple structure is maintained, then device complexity is reduced and manufacturing is easier, but charge transfer characteristics deteriorate and signal delay increases

Engineering Contradiction:
Improvedevice structure simplicityVSAvoidcharge transfer characteristic
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies local quality principle by optimizing the specific region between the first electrode and the photoelectric conversion layer with a specially designed inorganic oxide semiconductor material layer. This localized optimization ensures excellent charge transfer characteristics at the critical interface without complicating the overall simple device structure, maintaining ease of manufacturing while improving reliability.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enables superior charge transfer characteristics, reducing signal delay and improving image quality while maintaining a simple structure.

Implementation Method 1

an inorganic oxide semiconductor material layer is formed between the first electrode and the photoelectric conversion layer

Methodology Applied
Scientific EffectCharge conduction: Conduction (electrical)

Implementation Method 2

a photoelectric conversion layer including an organic material... perform photoelectric conversion of a specific color (wavelength band)

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS12284857B2Imaging element, stacked imaging element and solid-state imaging device, and inorganic oxide semiconductor material
Publication Date: 2025.04.22 SONY GROUP CORP
  • US12284857B2 patent drawing
  • US12284857B2 patent drawing
  • US12284857B2 patent drawing

AI summary

Provided is an imaging element that includes a photoelectric conversion section. The photoelectric conversion section includes a first electrode, a photoelectric conversion layer including an organic material, and a second electrode that are stacked, an inorganic oxide semiconductor material layer is formed between the first electrode and the photoelectric conversion layer, and when a composition of an inorganic oxide semiconductor material included in the inorganic oxide semiconductor material layer is represented by MaNbSncO (where M denotes an aluminum (Al) atom, and N denotes a gallium atom (Ga) or a zinc (Zn) atom, or a gallium (Ga) atom and a zinc (Zn) atom), a+b+c=1.00, 0.01≤a≤0.04, and b<c are satisfied.