Organic Interposer Structure for High-Density Chip Interconnection

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Solution Overview

Problem

Current semiconductor package technologies, such as 2D and 2.5D packages, face limitations in achieving high-density integration due to substrate processing capabilities and high costs associated with silicon interposers, which restrict the density and complexity of chip interconnections.

Innovation Solution

The development of an organic interposer structure manufacturing method using a bearing plate with a temporary bonding layer, photosensitive dielectric layers, and metallization to form conducting posts and circuit layers, followed by surface treatment, enabling the creation of a redistribution layer with high-resolution capabilities and low processing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If silicon interposers are used to achieve high-density integration, then chip interconnection density and complexity are improved, but processing difficulty and cost increase significantly

Engineering Contradiction:
Improvechip interconnection densityVSAvoidprocessing difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent replaces expensive silicon interposers with organic interposer materials that are cheaper and easier to process. The organic interposer achieves comparable interconnection density without the high processing difficulty and cost associated with silicon, effectively using a less durable but more manufacturable material to solve the contradiction.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent changes the material parameter from silicon to organic materials, fundamentally altering the processing characteristics. This material substitution enables high-density interconnections to be achieved through simpler, lower-cost manufacturing processes, resolving the contradiction between manufacturing precision and ease of manufacture.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If silicon interposers are used to achieve high-density integration, then chip interconnection density and complexity are improved, but cost increases significantly

Engineering Contradiction:
Improvechip interconnection densityVSAvoidcost
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent substitutes expensive silicon interposers with cost-effective organic interposer materials. This material replacement maintains the required interconnection density while dramatically reducing manufacturing costs, directly addressing the contradiction between manufacturing precision and cost.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent creates an organic interposer that copies the functional characteristics of silicon interposers (interconnection density, electrical properties) but uses fundamentally different, cheaper materials and processes, achieving the same technical outcome at lower cost.

Inventive Principle:
Principle #26Copying

3Ease of manufacture

If conventional substrate processing is used, then processing simplicity is maintained, but high-density integration capability is limited

Engineering Contradiction:
Improveprocessing simplicityVSAvoidintegration density
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The patent uses composite organic materials for the interposer structure, combining multiple dielectric and conductive layers to achieve high-density interconnections. This composite approach enables conventional processing methods to produce advanced high-density integration, resolving the contradiction between processing simplicity and integration density.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The patent employs multi-layer stacked distribution units in a three-dimensional configuration, enabling high-density integration through vertical stacking rather than horizontal expansion. This dimensional approach allows conventional processing to achieve advanced integration densities by utilizing the third dimension.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method allows for the production of high-density I/O chip flip packages with reduced processing difficulty and cost, achieving panel-level processing and 2.5D package capabilities while simplifying chip and substrate connections.

Implementation Method 1

forming a window on the photosensitive dielectric layer by means of exposure and development

Methodology Applied
Scientific EffectPhotodecomposition: Photodissociation

Implementation Method 2

electroplating the circuit layer pattern to form the conducting post and the circuit layer

Methodology Applied
Scientific EffectElectroplating: Electroplating

Data Source

PatentUS20240312796A1Organic interposer structure, manufacturing method and package structure thereof
Publication Date: 2024.09.19 ZHUHAI ACCESS SEMICONDUCTOR CO LTD
  • US20240312796A1 patent drawing
  • US20240312796A1 patent drawing
  • US20240312796A1 patent drawing

AI summary

A manufacturing method for an organic interposer structure includes (a) providing a bearing plate, (b) applying a temporary bonding layer on the bearing plate, (c) applying a photosensitive dielectric layer on the temporary bonding layer, (d) forming a window on the photosensitive dielectric layer and performing metallization to form a circuit layer, (e) repeating the steps (c) and (d) on the circuit layer until the target number of layers is achieved, (f) de-bonding the temporary bonding layer and removing the bearing plate to expose the conducting post, (g) thinning the exposed conducting post to form a first pad, forming a solder mask layer on the surface of the outermost exposed circuit layer, wherein the solder mask layer exposes part of the circuit layer to form a second pad, and (h) performing a metal surface treatment on the first and second pads.