Organic Pattern Testing via Virtual Figure Alignment
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Solution Overview
Problem
Conventional methods for testing organic patterns in OLED displays are inefficient, relying on visual inspection with high-resolution microscopes and require manual correction of evaporation sources, which is time-consuming and prone to errors.
Innovation Solution
A method involving the formation of organic patterns on a test substrate through masks, followed by photography to acquire test images and check if the pattern edges align with virtual test figures, allowing for the detection of deposition errors and enabling precise adjustments to the substrate, mask, or evaporation source positions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If visual inspection with high-resolution microscopes is used to test organic patterns, then measurement precision is improved, but loss of time increases due to manual correction requirements
Solution Approach 1:
The patent replaces the mechanical visual inspection process with an automated optical testing system. A test image is photographed showing the organic pattern, pixel patterns, and virtual test figures on the substrate. Image processing automatically analyzes whether organic pattern edges overlap with virtual test figure edges, eliminating the need for manual microscope inspection and correction.
Solution Approach 2:
The patent creates a virtual test figure that is a copy or representation of the expected organic pattern geometry. This virtual figure is displayed on the substrate and used as a reference for automated comparison with the actual deposited organic pattern, enabling objective and rapid testing without manual measurement.
2Manufacturing precision
If manual correction of evaporation sources is performed, then manufacturing precision can be improved, but productivity decreases due to time-consuming operations
Solution Approach 1:
The patent implements an automated feedback system where the test image is processed to determine whether organic pattern edges overlap with virtual test figure edges. This provides immediate, objective feedback on deposition quality, eliminating the need for manual inspection and correction of evaporation sources, thereby improving both precision and productivity.
Solution Approach 2:
The testing system performs self-assessment by automatically analyzing the test image and comparing the organic pattern position with the virtual test figure. The system independently determines whether overlap occurs without requiring manual intervention, enabling rapid iterative testing and correction of deposition parameters.
3Device complexity
If conventional testing methods are used, then device complexity is reduced, but ease of operation worsens due to manual intervention requirements
Solution Approach 1:
The patent replaces manual operational steps with automated image processing. The system automatically photographs the test substrate, processes the test image to identify organic pattern edges and virtual test figure edges, and determines overlap conditions without requiring operator intervention, significantly improving ease of operation.
Solution Approach 2:
The testing system integrates multiple functions into a single automated process: photographing the substrate, displaying virtual test figures, processing the test image, and determining overlap conditions. This multi-functional approach simplifies operation while maintaining comprehensive testing capability.
Data Source
AI summary
A method for testing an organic pattern including: forming an organic pattern on a test substrate through a mask; acquiring a test image by photographing a predetermined test area of the test substrate; and checking whether an edge of the organic pattern displayed to the test image goes over an edge of a virtual test figure.