Orientation Parameter Measurement Using Light Intensity Normalization

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing methods for determining the orientation parameter of organic EL materials require complex simulation calculations, leading to increased calculation times.

Innovation Solution

A method involving an orientation characteristic measurement system that calculates the orientation parameter by detecting and normalizing light intensity using a light detector and optical systems, specifying intensity in a maximum area between 0° and 90°, and applying a linear relationship based on predetermined film thickness and refractive index.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If complex simulation calculation is used to determine the orientation parameter, then measurement precision is improved, but calculation time increases

Engineering Contradiction:
Improveorientation parameter determination accuracyVSAvoidcalculation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent pre-calculates and stores the relationship between orientation parameters and light intensity characteristics in a lookup table before actual measurement. During measurement, the system only needs to query this pre-prepared data, avoiding time-consuming simulation calculations while maintaining measurement precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent creates a simplified model that copies the essential characteristics of the complex simulation. By measuring light intensity at specific angles and comparing it with pre-stored reference data, the system replicates the accuracy of full simulation without the computational burden.

Inventive Principle:
Principle #26Copying

2Measurement precision

If complex simulation calculation is used to determine the orientation parameter, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveorientation parameter determination accuracyVSAvoidcalculation system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential measurement components needed for orientation parameter determination. Instead of implementing a full simulation system, it isolates the critical function of measuring light intensity at specific angles and comparing it with pre-stored reference data, thereby reducing device complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent replaces expensive and complex simulation calculation resources with a simpler, pre-computed lookup table approach. This substitution uses minimal computational resources during actual measurement while maintaining accuracy, effectively trading off complex processing power for pre-prepared simple data structures.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach simplifies the measurement of molecular orientation characteristics by reducing calculation complexity and time, allowing for efficient determination of the orientation parameter.

Implementation Method 1

a light detector configured to detect the detection light

Methodology Applied
Scientific EffectLight detection: Photoelectric Effect

Implementation Method 2

detection light emitted from the sample with the irradiation of the irradiation light

Methodology Applied
Scientific EffectFluorescence emission: Fluorescence

Data Source

PatentUS11920921B2Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
Publication Date: 2024.03.05 HAMAMATSU PHOTONICS KK
  • US11920921B2 patent drawing
  • US11920921B2 patent drawing
  • US11920921B2 patent drawing

AI summary

An orientation characteristic measurement system (1) includes an irradiation optical system (5), a detection optical system (11), a light detector (13), a rotation mechanism (9) changing an angle (ϕ) between a surface of the sample and an optical axis (L2) of the detection optical system (11), and a computer (15), and the computer (15) includes a rotation mechanism control unit (32) controlling the rotation mechanism (9), a distribution acquisition unit (34) normalizing an angle-dependent distribution of light intensity to acquire an angle-dependent distribution of light intensity, an area specifying unit (35) specifying light intensity in a maximum area on the basis of the angle-dependent distribution of the light intensity, and a parameter calculation unit (36) calculating the orientation parameter (S) on the basis of a linear relationship determined using the film thickness and refractive index of the sample and the light intensity in the maximum area.