Orthogonal Array Test Plan for Comprehensive Parameter Coverage
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Solution Overview
Problem
Traditional test methods fail to comprehensively cover all product parameters and their levels due to resource and time constraints, leading to incomplete quality assessment and increased risk of product anomalies or malfunctions.
Innovation Solution
A design and test method utilizing a standard orthogonal array converted into a conversion orthogonal array to create a test plan that includes all input, output, and system parameters at various levels, allowing for automated execution of test cases to gather operation data and state reports, thereby ensuring comprehensive testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If all test cases with different test conditions covering all parameters and levels are performed, then product quality assessment is comprehensive, but test time and resources are excessive
Solution Approach 1:
The patent applies partial action by selecting a representative subset of test cases from the complete test space. Instead of executing all possible combinations of parameters and levels, the system uses orthogonal array theory to identify a minimal set of test cases that still provides comprehensive coverage of all parameters and their interactions, thereby reducing test time while maintaining assessment quality
Solution Approach 2:
The patent transforms the test planning approach by changing from exhaustive parameter combination to orthogonal array-based parameter selection. This mathematical transformation allows the system to represent comprehensive test coverage in a condensed format, where each parameter and its levels are systematically distributed across a reduced number of test cases, achieving both completeness and efficiency
2Loss of time
If traditional test method selects only some specific parameters for testing, then test time is reduced, but product quality and performance cannot be ensured
Solution Approach 1:
The patent makes the test plan universal by designing it to cover all parameters and their levels simultaneously through orthogonal array structure. Unlike traditional methods that focus on specific parameters, this approach creates a test plan that can adaptively cover any combination of parameters and levels, making the testing process both time-efficient and comprehensively reliable
Solution Approach 2:
The patent performs preliminary action by pre-generating the orthogonal array test plan that systematically includes all parameters and levels before actual testing begins. This pre-planning ensures that no important parameter or level is overlooked during execution, while the condensed structure of the orthogonal array keeps the overall test time manageable
Data Source
AI summary
The present disclosure discloses a design and test method of a test plan. The test plan includes the plurality of input parameters, the plurality of output parameters, the plurality of system parameters, all of the numerical levels or the types of each input parameter, each output parameter and each system parameter. The test plan includes a plurality of test cases to cover combination conditions including a great number of the input parameters, the output parameters and the system parameters and their dynamic cross of the parameters. The design and test method performs the test cases of the test plan on the product automatically by considering overall possibly parameters and their levels associated with the product. The overall possibly parameters and their levels associated with the product can be tested before the product is dispatched to the customer so as to enhance the product quality.