Non-Uniform ADC Sampling for Higher-Bandwidth Oscilloscopes

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Solution Overview

Problem

Existing test and measurement instruments face challenges in handling high-speed signals due to the requirement for high-frequency sampling, which increases complexity and cost, and conventional sampling methods fail to efficiently recover original signals from fewer samples.

Innovation Solution

Implementing compressive sensing techniques in oscilloscopes to achieve higher bandwidth by using non-uniform sampling and L1 minimization methods, allowing recovery of original signals from fewer samples than Nyquist sampling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If high-frequency sampling is used to avoid aliasing and signal distortion, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improvesignal reconstruction accuracyVSAvoidsampling system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent changes the sampling parameter from uniform high-frequency sampling to non-uniform sub-Nyquist sampling. By varying the sampling intervals according to a pseudo-random sequence, the system achieves accurate signal reconstruction at lower sampling rates, resolving the contradiction between measurement precision and device complexity

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces the traditional mechanical approach of high-speed sampling with a computational approach using compressive sensing algorithms. Instead of increasing sampling hardware speed, the system uses signal processing techniques to reconstruct signals from fewer samples, reducing device complexity while maintaining measurement precision

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Speed

If high-frequency sampling is used to handle higher speed signals, then bandwidth is improved, but cost increases

Engineering Contradiction:
Improvesignal bandwidthVSAvoidinstrument cost
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The patent changes the fundamental sampling parameter from fixed high-frequency intervals to variable sub-Nyquist intervals based on pseudo-random sequences. This parameter change enables the system to achieve higher effective bandwidth without proportionally increasing sampling hardware requirements, thus reducing cost

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent introduces a temporal dimension to the sampling process by using pseudo-random sampling sequences instead of uniform intervals. This dimensional change in sampling strategy allows the system to capture signal information more efficiently, achieving higher bandwidth处理能力 with reduced hardware cost

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If uniform sampling at Nyquist rate is used, then signal reconstruction is reliable, but sampling rate must be twice the highest frequency component

Engineering Contradiction:
Improvesignal reconstruction reliabilityVSAvoidsampling efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent inverts the traditional sampling paradigm by sampling below the Nyquist rate rather than at or above it. By using non-uniform pseudo-random sampling intervals, the system achieves reliable signal reconstruction at lower sampling rates, improving productivity while maintaining reliability through compressive sensing theory

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentUS20250277820A1Compressed sensing in oscilloscopes for higher bandwidth
Publication Date: 2025.09.04 TEKTRONIX INC
  • US20250277820A1 patent drawing
  • US20250277820A1 patent drawing
  • US20250277820A1 patent drawing

AI summary

A test and measurement instrument includes one or more ports to receive a signal from a device under test (DUT), an array of analog to digital converters (ADC) to receive the signal, a data collector to output one sample from each ADCs during one ADC clock cycle, and one or more processors to provide a sample clock to each ADC having a different clock phase from other ADCs to cause non-uniform sample spacing at or below a Nyquist frequency, and to cause the ADCs to output samples with non-uniform spacing. A method includes receiving a signal from a device under test, providing a sample clock to each ADC in an array of ADCs having a different clock phase from clock phases provided to other ADCs causing non-uniform sample spacing at or below a Nyquist frequency, sampling the signal with a non-uniform sample clock, and outputting the samples with non-uniform spacing.