Oscilloscope Probe Characterization and Correction Method

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Characterizing and correcting the input impedances and responses of voltage and current probes, as well as the transmitted response of cables, is a complex and time-consuming process that typically requires specialized equipment like Vector Network Analyzers (VNAs) and external circuit simulators, which not all users have access to.

Innovation Solution

A method involving measuring output signals with and without the probe or cable connected, using a signal generator and oscilloscope to characterize and correct responses, allowing for the determination of input impedances and transfer functions without the need for VNAs or additional equipment, by applying correction filters based on ideal frequency responses.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If VNA and external circuit simulators are used to characterize probes and cables, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvecharacterization accuracyVSAvoidequipment complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the characterization function from complex external equipment (VNA) and implements it within the oscilloscope itself. The oscilloscope measures probe and cable responses directly and generates correction filters internally, eliminating the need for separate VNA and simulation equipment while maintaining characterization accuracy.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The oscilloscope is designed to perform multiple functions: it acts as both the measurement instrument and the characterization tool. The same oscilloscope that measures signals can also characterize probes and cables by measuring their responses and generating correction filters, consolidating multiple specialized devices into one universal instrument.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If VNA and external circuit simulators are used to characterize probes and cables, then measurement precision is improved, but loss of time increases

Engineering Contradiction:
Improvecharacterization accuracyVSAvoidcharacterization time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines the characterization process with the measurement process. By measuring probe and cable responses directly during normal operation and generating correction filters on-the-fly, the system eliminates separate characterization steps, reducing total time while maintaining accuracy through integrated processing.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system performs preliminary measurements of probe and cable responses to establish baseline characteristics. These preliminary measurements enable the generation of correction filters that can be applied to subsequent measurements, streamlining the overall process and reducing repeated characterization time.

Inventive Principle:
Principle #10Preliminary action

3Device complexity

If simple measurement equipment is used to characterize probes and cables, then device complexity is reduced, but measurement precision deteriorates

Engineering Contradiction:
Improveequipment simplicityVSAvoidcharacterization accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent replaces complex external measurement systems with a software-based characterization approach within the oscilloscope. By using digital signal processing and mathematical models to generate correction filters, the system achieves high precision without requiring additional complex hardware equipment.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system changes the approach from physical equipment complexity to computational precision. By using advanced algorithms and mathematical models within the oscilloscope's processing capabilities, the system achieves accurate characterization and correction without requiring complex external measurement equipment.

Inventive Principle:
Principle #35Parameter changes

4Measurement precision

If comprehensive characterization procedures are implemented, then measurement precision is improved, but ease of operation deteriorates

Engineering Contradiction:
Improvecharacterization accuracyVSAvoiduser accessibility
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The oscilloscope performs self-characterization by automatically measuring probe and cable responses and generating correction filters without requiring external equipment or complex user setup. The system serves itself by using its own measurement capabilities to characterize its accessories, greatly simplifying the user experience while maintaining accuracy.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent introduces an intermediary processing layer within the oscilloscope that automatically handles the complex characterization mathematics. This intermediary layer translates simple user actions (connecting the probe/cable) into comprehensive characterization results, shielding users from complexity while achieving precise measurements.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS9618599B2Characterization and correction of voltage probe, current probe and cable
Publication Date: 2017.04.11 KEYSIGHT TECHNOLOGIES INC
  • US9618599B2 patent drawing
  • US9618599B2 patent drawing
  • US9618599B2 patent drawing

AI summary

Responses of voltage and current probes are characterized or corrected. A voltage probe method includes measuring output of the voltage probe and a first output of a through, in response to an input signal applied to the through, with the voltage probe connected, measuring a second output of the through with the voltage probe disconnected, and characterizing the response of the voltage probe using the output of the voltage probe and the first and/or second outputs. A current probe method includes measuring output current of the current probe and first output current of a through, in response to an input signal applied to the through with the current probe connected in series, measuring second output current of the through with the current probe disconnected, and characterizing the response of the current probe using the output current of the current probe and the first and/or second output currents of the through.