OTPM Parallel Breakdown Circuit for Unbiased Random Bit Generation
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Solution Overview
Problem
Conventional methods for generating cryptographic keys in smart devices, including software-based algorithms and hardware-based Physically Unclonable Functions (PUF), often lack true randomness, which can compromise security, and post-processing techniques are complex and difficult to implement due to hardware constraints.
Innovation Solution
A system and method utilizing a predefined number of One-time Programmable Memory (OTPM) devices connected in parallel, with a current limiting circuit and voltage source to induce a controlled breakdown in one OTPM device, generating a random bit string while leaving others unbroken, thereby producing unbiased random bits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If software-based algorithms are used for generating cryptographic keys, then key generation is simple to implement, but the keys are not truly random and can be compromised
Solution Approach 1:
The patent replaces software-based key generation with a hardware-based system using OTPM devices. The physical breakdown mechanism of OTPM cells under high voltage stress provides true randomness, substituting algorithmic generation with physical phenomenon-based generation. This resolves the contradiction by using hardware (physical breakdown) instead of software (algorithmic generation) to achieve both simplicity and true randomness.
2Reliability
If hardware-based PUF is used for generating keys, then true randomness is achieved, but post-processing techniques are complex and difficult to implement
Solution Approach 1:
The patent extracts only the essential element needed for randomness generation - the broken/unbroken state of OTPM devices - and eliminates the need for complex post-processing algorithms. By directly using the physical state of OTPM devices as the random bit source, the system removes the complicated post-processing layer that characterizes traditional PUF systems, achieving true randomness without complexity.
Solution Approach 2:
The patent uses OTPM devices that are designed to be used once - either broken or unbroken - similar to disposable objects. Each OTPM device serves its purpose of generating a random bit and then is discarded (in the sense that its state is fixed and cannot be changed). This simplifies the system by eliminating the need for complex post-processing and reconfiguration, as each device is a simple, single-use random bit generator.
3Productivity
If high voltage is applied to OTPM devices, then breakdown occurs generating random bits, but all devices may break down simultaneously losing control
Solution Approach 1:
The patent divides the high voltage stress application into individual, controllable pulses for each OTPM device rather than applying continuous high voltage to all devices simultaneously. This segmentation allows precise control over which devices break down and when, enabling deterministic control over the random bit generation process while maintaining the ability to generate multiple random bits systematically.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach generates unbiased random bit strings efficiently, overcoming the limitations of existing methods by ensuring security through true randomness without complex post-processing algorithms, and is suitable for smart devices and IoT applications.
Implementation Method 1
the predefined voltage when supplied, produces a breakdown in one of an OTPM device of the at least two OTPM devices resulting in a broken OTPM device
Data Source
AI summary
Embodiments herein provide a system and a method for generating a random bit string in an Integrated Circuit. Predefined number of One-time Programmable Memory (OTPM) devices are connected in parallel with each OTPM device configured for producing a random bit-string. Current limiting circuit is connected in series with the at least two OTPM devices. Voltage source supplies a predefined voltage to the at least two OTPM devices for producing a breakdown in one of an OTPM device of the at least two OTPM devices resulting in a broken OTPM device while leaving remaining OTPM devices of the at least two OTPM devices unbroken. The random bit string is generated through at least one of the broken OTPM device and a remaining unbroken OTPM device of the at least two OTPM devices.