Outline Inspection Overlay for Clear Defect Reference Comparison
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Solution Overview
Problem
Conventional inspection systems fail to provide users with clear insights into the reference information responsible for determining whether an inspection object is good or defective, as the results are simply displayed as good or defective without context.
Innovation Solution
An inspection system and method that perform image processing on the outline of an inspection object, overlapping the processed image with reference information to determine if it is good or defective, including reference values for height, width, and slope, allowing users to easily identify suitable reference information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If inspection results are simply displayed as good or defective, then the inspection process is fast and simple, but users cannot easily determine what reference information is accountable for the determination
Solution Approach 1:
The patent transitions from simple 2D binary display (good/defective) to multi-dimensional visual display by overlaying reference information images with different transparency levels. The processed outline image is displayed with first transparency, reference information with second transparency, allowing users to see both simultaneously and determine suitability across multiple dimensions of information
Solution Approach 2:
The patent creates visual copies of reference information by displaying the processed outline image together with overlaid reference information images. These copies allow users to compare the actual inspection object features with reference standards without adding physical complexity to the inspection system itself
2Loss of information
If image processing and overlay display of reference information is implemented, then users can easily determine reference information suitability, but the processing and display system becomes more complex
Solution Approach 1:
The patent merges the processed outline image and reference information images into a single composite display. By combining these visual elements with different transparency levels, the system preserves all necessary information (actual object features and reference standards) without requiring separate display systems or complex post-processing analysis
3Loss of information
If multiple display units are used to show different inspection details, then comprehensive information is provided, but the system complexity increases
Solution Approach 1:
The patent makes the display unit multi-functional by enabling it to simultaneously display the processed outline image, reference information, and their overlay combination. A single display unit performs multiple functions: showing actual inspection results, displaying reference standards, and presenting their comparison, eliminating the need for multiple separate display devices
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables users to easily determine the suitability of reference information for inspection objects by visually displaying the image-processed outline with corresponding reference values, enhancing understanding of inspection results.
Implementation Method 1
an inspection system irradiates a product, that is, an inspection object, with patterned light generated by a projection unit, and receives light reflected from the inspection object in an imaging unit to acquire an image of the inspection object
Data Source
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AI summary
Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.