Multi-Channel Output Pad Switching for Compact Semiconductor Testing
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Solution Overview
Problem
Conventional multi-channel semiconductor devices require a large number of output pads for testing, which occupies excessive space and increases testing time and cost, making it inefficient.
Innovation Solution
A multi-channel semiconductor device with a channel switching portion that controls connection between buffer groups and pad groups, allowing for fewer output pads by using a first and second operation mode to output signals, enabling efficient testing without separate test pads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate test pads are added to monitor output signals during testing, then testing performance is improved, but the area occupied on the semiconductor device increases excessively
Solution Approach 1:
The output pads are designed to serve dual functions: during normal operation they transmit image signals to the display panel, and during test mode they sequentially output signals from all buffer groups for comprehensive testing. This multi-functionality eliminates the need for separate dedicated test pads, resolving the contradiction between testing performance and area occupation.
Solution Approach 2:
The patent implements a dynamic switching mechanism that changes the function of output pads between normal mode and test mode. In normal mode, each pad corresponds to a specific buffer group for signal transmission. In test mode, the switching portion dynamically reconfigures the connections to allow sequential testing of all buffer groups through fewer pads, thereby reducing area occupation while maintaining testing effectiveness.
2Adaptability or versatility
If a large number of output pads are used for multi-channel signal transmission, then signal transmission capability is improved, but the area occupied on the semiconductor device increases
Solution Approach 1:
The patent merges the functions of multiple output pads into fewer pads by implementing a switching portion that dynamically routes signals from multiple buffer groups through a shared set of output pads. This combining approach maintains the multi-channel signal transmission capability while reducing the total number of pads required, thereby decreasing area occupation.
Solution Approach 2:
The patent introduces a time dimension to the signal transmission by implementing sequential output mode. Instead of requiring simultaneous access to multiple pads for testing all buffer groups, the system sequentially switches connections over time, allowing comprehensive testing through fewer pads. This temporal multiplexing resolves the area occupation issue while maintaining full signal transmission capability.
3Reliability
If separate test pads are added for testing, then testing completeness is improved, but testing time and cost increase
Solution Approach 1:
The output pads perform dual roles as both signal transmission interfaces and test monitoring points. During test mode, the switching portion sequentially connects all buffer groups to the output pads, enabling comprehensive testing of all channels through the same pads used for normal operation. This eliminates the need for separate dedicated test pads and reduces testing time while maintaining testing completeness.
Solution Approach 2:
The patent enables continuous utilization of the output pads for both normal signal transmission and testing operations without requiring separate test infrastructure. The switching portion allows seamless transition between normal mode and test mode, ensuring that the same pads are continuously productive whether transmitting image signals or performing comprehensive channel testing, thereby reducing testing time and cost.
Data Source
AI summary
A multi-channel semiconductor device comprises a plurality of buffer groups each comprising at least one output buffer, a plurality of pad groups each comprising at least one output pad, and a channel switching portion that controls connection between the plurality of buffer groups and the plurality of pad groups. One of the pad groups outputs an output signal of one of the buffer groups in a first operation mode and sequentially outputs output signals of all of the buffer groups in a second operation mode.