Overlapped Frequency Band Stitching for Spectrum Analysis

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Solution Overview

Problem

Conventional spectrum analyzers face limitations in processing wide frequency spans due to hardware speed and processing constraints, requiring multiple acquisitions and stitching of uniform frequency bands, which is inefficient and suboptimal for non-uniform spans.

Innovation Solution

A test and measurement instrument with non-uniform overlapping frequency bands allows for reduced stitching frequency by processing each band as if the full band were present, using digital down conversion and transform sections with consistent configuration settings across bands, and masking unwanted portions to combine them into a full spectrum.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If multiple acquisitions with uniform frequency bands are used to cover wider frequency spans, then the frequency span coverage is improved, but the number of stitching operations increases and processing efficiency deteriorates

Engineering Contradiction:
Improvefrequency span coverageVSAvoidprocessing efficiency
Core Design Contradiction:
Length of stationary objectVSProductivity

Solution Approach 1:

The frequency spectrum is divided into multiple overlapping bands that are processed simultaneously through parallel signal paths. Each band is handled by dedicated filter and mixer components, allowing concurrent processing of multiple frequency portions without sequential stitching operations.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple frequency bands are combined into a single acquisition process rather than performing separate acquisitions and stitching operations. The overlapping bands are processed together through unified digital down conversion and transformation, eliminating the need for multiple sequential stitching operations.

Inventive Principle:
Principle #5Merging (Combining)

2Length of stationary object

If multiple acquisitions with different settings are performed to cover wider frequency spans, then the frequency span coverage is improved, but the device complexity and processing time increase

Engineering Contradiction:
Improvefrequency span coverageVSAvoidprocessing complexity
Core Design Contradiction:
Length of stationary objectVSDevice complexity

Solution Approach 1:

The signal processing system is configured to handle multiple frequency bands simultaneously using unified processing components. The same digital down converter and transform section process all bands with consistent settings, eliminating the need for multiple specialized processing paths and reducing overall system complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system performs preliminary filtering and mixing of multiple frequency bands before the digital transformation stage. By preparing multiple bands in advance through parallel analog processing, the subsequent digital processing operates on pre-conditioned signals, reducing computational complexity and processing time.

Inventive Principle:
Principle #10Preliminary action

3Stability of the object's composition

If uniform frequency bands are used for multiple acquisitions, then the processing settings consistency is improved, but the adaptability to non-uniform frequency spans deteriorates

Engineering Contradiction:
Improveprocessing settings consistencyVSAvoidadaptability to non-uniform spans
Core Design Contradiction:
Stability of the object's compositionVSAdaptability or versatility

Solution Approach 1:

The frequency band configuration is made dynamic and adaptable rather than fixed and uniform. The system can configure overlapping bands with varying widths and positions according to the specific frequency span requirements, allowing flexible adaptation to non-uniform spans while maintaining processing consistency through unified digital processing.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

Different portions of the frequency spectrum can be processed with locally optimized parameters while maintaining overall processing consistency. The system allows non-uniform band configurations in different frequency regions based on signal characteristics and span requirements, with each region processed through the same unified digital down conversion and transform section.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach minimizes the number of configuration changes, reduces hardware requirements, and allows for more flexible and efficient processing of user-specified frequency spans by combining non-uniform bands, thereby enhancing performance and reducing the need for frequent stitching.

Implementation Method 1

The mixer 130 mixes the bands 2 through N with a local oscillator signal 125

Methodology Applied
Scientific EffectMixing: Heterodyne

Implementation Method 2

Low pass filter 135 removes local oscillator feed-through and image spectrums that result from the mixing process

Methodology Applied
Scientific EffectFiltering: Filter (electronic)

Implementation Method 3

The analog-to-digital converter (ADC) 145 receives bands 1 through N from switch 140, and digitizes them

Methodology Applied
Scientific EffectAnalog-to-digital conversion:

Implementation Method 4

After the ADC, the signal may be further conditioned by a digital down converter (DDC) section 160, which may adjust the center frequency and reduce the sample rate

Methodology Applied
Scientific EffectDigital down conversion:

Implementation Method 5

The bands are then transformed using transform 158, which can be a Fourier transform, among other suitable transform operations

Methodology Applied
Scientific EffectFourier transform:

Data Source

PatentEP2515127B1Apparatus and method for analyzing a frequency spectrum using overlapped frequency bands
Publication Date: 2018.11.21 TEKTRONIX INC
  • EP2515127B1 patent drawingFigure 1
  • EP2515127B1 patent drawingFigure 2A
  • EP2515127B1 patent drawingFigure 2B

AI summary

A test and measurement instrument and associated methods for acquiring and stitching wide overlapped non-uniform frequency bands so that a user specified band can be efficiently displayed and analyzed is disclosed. The test and measurement instrument includes a user interface (298) to receive the user specified frequency span. Acquisition circuitry (203) acquires one or more predefined frequency bands (270)having non-uniform overlapping frequency ranges. A frequency band processing section (290) can decimate (252) the acquired frequency bands, mask (294) the acquired frequency bands, and stitch (296) the masked frequency bands together. A display section (202) displays the user specified frequency span using the stitched frequency bands. Due to the overlap configuration of the wide non-uniform bands, any user specified span between 50 kHz and 6 GHz, or thereabout, can be covered by two bands.