Overlapping Frequency Sweep for DUT Testing

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Solution Overview

Problem

The testing of complex electronic devices is time-consuming and costly due to the need for multiple adjustments and measurements across various frequency ranges, which slows down manufacturing processes.

Innovation Solution

A method and apparatus that apply multiple test signals across overlapping and differing frequency ranges, with initial sweeps providing quick frequency dependence estimation and subsequent sweeps increasing resolution by adding additional measurements, allowing for precise and quick visualization of measurement plots.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If multiple adjustments are made during measurements to improve measurement precision, then measurement precision is improved, but productivity deteriorates due to time-consuming adjustments

Engineering Contradiction:
Improvefrequency response measurement precisionVSAvoidtesting speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent applies preliminary action by performing a first frequency sweep to obtain initial frequency response data before the actual precise measurement. This preliminary sweep allows the system to pre-adjust settings and have initial data available, reducing the time needed during subsequent precise measurements while maintaining measurement accuracy.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements continuity of useful action by performing multiple overlapping frequency sweeps without stopping or making manual adjustments between them. The measurement process continues continuously with automated sweeps at different frequency ranges, eliminating idle time and manual intervention while accumulating precise measurement data.

Inventive Principle:
Principle #20Continuity of useful action

2Measurement precision

If frequency range is swept through multiple periods to improve measurement accuracy, then measurement precision is improved, but loss of time increases

Engineering Contradiction:
Improvefrequency response resolutionVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies segmentation by dividing the overall frequency range measurement into multiple separate frequency sweeps, each covering a specific frequency range. Instead of performing one long continuous sweep that would take excessive time, the frequency range is segmented into multiple manageable sweeps that can be performed quickly and overlapped to achieve complete frequency coverage with high resolution.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements periodic action by performing repeated frequency sweeps at different frequency ranges multiple times. Each frequency range is swept periodically to accumulate measurement data, and the periodic repetition of sweeps at overlapping frequency ranges improves measurement precision through data averaging while managing total measurement time.

Inventive Principle:
Principle #19Periodic action

3Reliability

If multiple control adjustments are made during measurement to improve reliability, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improvefunctionality verification reliabilityVSAvoidmeasurement control complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies self-service by implementing automated control systems that perform frequency sweep adjustments, signal generation, and data acquisition without external intervention. The measurement system serves itself by automatically configuring parameters and executing multiple frequency sweeps, reducing the need for complex external control mechanisms while maintaining reliable functionality verification.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS11131704B2Method and measuring apparatus for testing a device under test
Publication Date: 2021.09.28 ROHDE & SCHWARZ GMBH & CO KG
  • US11131704B2 patent drawing
  • US11131704B2 patent drawing
  • US11131704B2 patent drawing

AI summary

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.