Overlapping Gate Metal Frame Layout for Compact Power Amplifiers

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Solution Overview

Problem

Current power amplifiers occupy a large area, hindering miniaturization and efficiency improvements in RF power transmission devices.

Innovation Solution

A semiconductor layout pattern featuring gate metal frames with overlapping sections, allowing for closer arrangement and reduced overall area, combined with a cascade power amplifier structure formed by stacking two semiconductor layout patterns.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If traditional power amplifier layout is used, then device functionality is ensured, but layout area is large which hinders miniaturization

Engineering Contradiction:
Improvelayout areaVSAvoiddevice functionality
Core Design Contradiction:
Area of moving objectVSAdaptability or versatility

Solution Approach 1:

The patent transitions from a planar two-dimensional layout to a three-dimensional stacked architecture. Multiple power amplifier units are arranged in vertical layers with alternating orientations, utilizing the third dimension (height/stacking direction) to reduce the footprint area while maintaining all necessary electrical connections and device functionalities through inter-layer routing and via structures.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements a nested arrangement where power amplifier units are stacked within a compact vertical space. Each layer contains complete functional units that are nested within the overall device structure, with lower layers supporting upper layers both physically and electrically, thereby maximizing space utilization and minimizing the overall layout area.

Inventive Principle:
Principle #7Nested doll (Nesting)

2Area of moving object

If gate metal frames are arranged with gaps for fabrication ease, then manufacturing is simplified, but overall area increases

Engineering Contradiction:
Improvelayout areaVSAvoidfabrication ease
Core Design Contradiction:
Area of moving objectVSEase of manufacture

Solution Approach 1:

The gate metal frames are divided into multiple discrete segments or sections rather than continuous structures. This segmentation allows the frames to be arranged in overlapping configurations with reduced gaps between adjacent frames, as each segment can be independently positioned and connected. The segmented approach enables closer spacing while maintaining fabrication feasibility through standard photolithography and metallization processes.

Inventive Principle:
Principle #1Segmentation

3Area of moving object

If power amplifier area is reduced for miniaturization, then product size decreases, but efficiency may be compromised

Engineering Contradiction:
Improvelayout areaVSAvoidpower amplifier efficiency
Core Design Contradiction:
Area of moving objectVSLoss of energy

Solution Approach 1:

The patent optimizes the local quality and arrangement of gate metal frames within each power amplifier unit. By carefully designing the frame geometry, thickness, and positioning in critical regions, the patent maintains effective current distribution and electrical characteristics even with reduced overall area. The overlapping frame configuration enhances local current paths and reduces resistive losses, thereby preserving efficiency despite miniaturization.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS20250174491A1Semiconductor layout pattern and semiconductor stack structure suitable for power amplifier
Publication Date: 2025.05.29 UNITED MICROELECTRONICS CORP
  • US20250174491A1 patent drawing
  • US20250174491A1 patent drawing
  • US20250174491A1 patent drawing

AI summary

The invention provides a semiconductor layout pattern, which comprises a substrate, a plurality of gate metal frames arranged on the substrate, a plurality of source/drain patterns and a plurality of gate patterns extending along an X direction and located in each gate metal frame, and the source/drain patterns and the plurality of gate patterns are alternately arranged along a Y direction, wherein any two adjacent gate metal frames are partially overlapped with each other, and the overlapping part of the two gate metal frames is defined as an overlapping line.