Oxide Semiconductor TFT Substrate with Protective Insulating Layer

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Solution Overview

Problem

The existing manufacturing processes for thin film transistor (TFT) substrates using oxide semiconductors face challenges such as damage to the semiconductor film during the formation of source and drain electrodes due to acid etching, leading to degradation of TFT characteristics and increased manufacturing costs due to the need for additional photolithography processes for etch stopper layers.

Innovation Solution

A TFT substrate configuration that includes a semiconductor film made of an oxide semiconductor with a protective insulating layer, where the source and drain electrodes are formed using conductors other than oxide conductors, and oxide conductors are used for the second source and drain electrodes, connected through contact holes, reducing the risk of oxidation-reduction reactions and eliminating the need for additional photolithography steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If acid etching is used to form source and drain electrodes on oxide semiconductor films, then the electrodes can be formed, but the semiconductor film is damaged and TFT characteristics are degraded

Engineering Contradiction:
Improveease of electrode formationVSAvoidTFT characteristics
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

A protective film is introduced as an intermediary layer between the oxide semiconductor film and the acid etching solution. This protective film allows acid etching to proceed for electrode formation while preventing direct contact between the acid and the semiconductor film, thus avoiding damage to the TFT characteristics.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The electrode formation process is segmented into multiple steps: first forming a protective film on the semiconductor film, then forming the electrode pattern on top of the protective film, and finally removing the protective film. This segmentation allows the acid etching to affect only the protective film and electrode materials, not the semiconductor film.

Inventive Principle:
Principle #1Segmentation

2Reliability

If additional photolithography processes are added to prevent semiconductor film damage, then TFT characteristics are protected, but manufacturing cost increases

Engineering Contradiction:
ImproveTFT characteristicsVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The protective film serves multiple functions: it protects the semiconductor film during acid etching, acts as a mask for electrode pattern formation, and can be removed selectively. This multi-functionality eliminates the need for separate etch stopper layers and additional photolithography processes, reducing manufacturing complexity while maintaining TFT characteristics.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If oxide conductors are used for source and drain electrodes, then contact properties improve, but oxidation-reduction reactions occur at the interface

Engineering Contradiction:
Improvecontact propertiesVSAvoidoxidation-reduction reactions
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The protective film acts as an intermediary barrier between the oxide conductor and the oxide semiconductor film, preventing direct chemical interaction. This allows oxide conductors to maintain their excellent contact properties while avoiding oxidation-reduction reactions at the interface that would degrade TFT characteristics.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS9941409B2Method for manufacturing a thin film transistor substrate
Publication Date: 2018.04.10 TRIVALE TECHNOLOGIES LLC
  • US9941409B2 patent drawing
  • US9941409B2 patent drawing
  • US9941409B2 patent drawing

AI summary

A thin film transistor substrate includes a semiconductor channel layer made of an oxide semiconductor, protective insulating layers that cover the semiconductor channel layer, a first source electrode, a first drain electrode, a second source electrode, and a second drain electrode. The second source electrode is located on the first source electrode and connected with the semiconductor channel layer through a first contact hole. The second drain electrode is located on the first drain electrode and connected with the semiconductor channel layer through a second contact hole.