Oxide Semiconductor Transistor Stack for Stable Normally-Off Operation

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Solution Overview

Problem

Existing transistors face challenges in achieving stable electrical characteristics, low leakage current in the off state, high frequency characteristics, normally-off electrical characteristics, small subthreshold swing values, and high reliability.

Innovation Solution

A semiconductor device structure is proposed, which includes a first insulator with a halogen element over a substrate, a second insulator, an oxide semiconductor in contact with the second insulator, a third insulator in contact with the oxide semiconductor, and conductors electrically connected to the oxide semiconductor. This structure is designed to provide stable electrical characteristics and low leakage current.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional transistor structures are used, then manufacturing is simpler, but electrical characteristics stability and reliability are insufficient

Engineering Contradiction:
Improveelectrical characteristics stabilityVSAvoidtransistor structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The transistor is divided into multiple functional regions including a first semiconductor region, a second semiconductor region, a third semiconductor region, and a fourth semiconductor region with different doping types and concentrations. This segmentation allows each region to be optimized for specific electrical characteristics, improving overall device reliability and stability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the transistor are assigned different local properties through varying doping types (n-type and p-type) and doping concentrations. The first and third semiconductor regions have different doping characteristics from the second and fourth regions, creating localized electrical properties that enhance device performance and reliability.

Inventive Principle:
Principle #3Local quality

2Reliability

If high doping concentration is used, then conductivity is improved, but leakage current increases

Engineering Contradiction:
Improvelow leakage currentVSAvoidleakage current in off state
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent employs different doping concentrations in different regions to optimize the balance between conductivity and leakage current. By carefully controlling the doping parameters in each semiconductor region, the device achieves low leakage current in the off state while maintaining good conductivity in the on state.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The transistor structure combines multiple semiconductor regions with different doping characteristics (n-type and p-type) to create a composite structure. This composite approach allows the device to achieve both low leakage current and high conductivity by leveraging the complementary properties of different doped regions.

Inventive Principle:
Principle #40Composite materials

3Productivity

If simple transistor structure is used, then manufacturing is easier, but frequency characteristics and subthreshold swing are insufficient

Engineering Contradiction:
Improvefrequency characteristicsVSAvoidtransistor structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The transistor is segmented into four distinct semiconductor regions with specific doping configurations, which enables improved frequency characteristics and subthreshold swing performance. This segmentation allows for optimized charge carrier control and reduced parasitic effects.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

By adjusting the doping concentrations and types in different regions, the patent optimizes the transistor's frequency characteristics and subthreshold swing. The parameter variations in doping create favorable electrical fields that enhance device performance metrics.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20250120126A1Semiconductor device and manufacturing method thereof
Publication Date: 2025.04.10 SEMICON ENERGY LAB CO LTD
  • US20250120126A1 patent drawing
  • US20250120126A1 patent drawing
  • US20250120126A1 patent drawing

AI summary

A transistor with stable electrical characteristics. A semiconductor device includes a first insulator over a substrate, a second insulator over the first insulator, an oxide semiconductor in contact with at least part of a top surface of the second insulator, a third insulator in contact with at least part of a top surface of the oxide semiconductor, a first conductor and a second conductor electrically connected to the oxide semiconductor, a fourth insulator over the third insulator, a third conductor which is over the fourth insulator and at least part of which is between the first conductor and the second conductor, and a fifth insulator over the third conductor. The first insulator contains a halogen element.