Oxide Semiconductor Transistor Layout for Integrated Pixel and Driver Circuits

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Solution Overview

Problem

Existing semiconductor devices face challenges in achieving high-speed operation and high display quality with both pixel and driver circuits on a single substrate, as they require conflicting characteristics such as high on/off ratio and high operation speed, which are difficult to reconcile for improved aperture ratio and definition.

Innovation Solution

The semiconductor device employs two types of transistors with oxide semiconductor layers, one for the pixel portion and another for the driver circuit, featuring crystalline regions with nanocrystals oriented perpendicular to the surface, allowing for high-speed operation and reliable electric characteristics, and includes an oxide conductive layer between the semiconductor and electrode layers to enhance performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If a single substrate is used for both pixel portion and driver circuit, then integration is improved, but conflicting transistor characteristics (high on/off ratio for pixel vs. high operation speed for driver) cannot be simultaneously satisfied

Engineering Contradiction:
Improvesubstrate integrationVSAvoidtransistor characteristic compatibility
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent applies local quality by forming two distinct types of transistors on the same substrate: first transistors with oxide semiconductor layers having crystalline regions for high on/off ratio in pixel portions, and second transistors with oxide semiconductor layers having amorphous regions for high operation speed in driver circuits. Each transistor type is optimized for its specific functional requirements while coexisting on a single substrate.

Inventive Principle:
Principle #3Local quality

2Illumination intensity

If aperture ratio is increased to improve display quality, then light transmission is improved, but definition and high-speed operation become more difficult to achieve

Engineering Contradiction:
Improveaperture ratioVSAvoiddefinition
Core Design Contradiction:
Illumination intensityVSManufacturing precision

Solution Approach 1:

The patent changes the structural parameters of the oxide semiconductor layers to resolve the contradiction between aperture ratio and definition. By controlling the crystalline/amorphous state and thickness of the semiconductor layers, the invention enables high aperture ratios while maintaining sufficient definition through the optimized transistor characteristics.

Inventive Principle:
Principle #35Parameter changes

3Speed

If oxide semiconductor layer is made thinner to improve transistor performance, then field-effect mobility is improved, but manufacturing precision and reliability become more challenging

Engineering Contradiction:
Improvefield-effect mobilityVSAvoidlayer thickness control
Core Design Contradiction:
SpeedVSManufacturing precision

Solution Approach 1:

The patent uses composite material structures with different oxide semiconductor layer configurations. First transistors use oxide semiconductor layers with crystalline regions for high reliability, while second transistors use oxide semiconductor layers with amorphous regions for high mobility. This composite approach allows optimization of each transistor type for its specific performance requirements.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enables the manufacturing of semiconductor devices with high-speed driver circuits and reliable pixel portions on a single substrate, improving display quality and aperture ratio while maintaining low off-state current and reducing leakage current.

Implementation Method 1

two kinds of transistors each of which includes an oxide semiconductor layer including a crystalline region on one surface side (in a superficial portion) are formed. The crystalline regions each include nanocrystals whose c-axes are oriented in a direction perpendicular to a surface of the first oxide semiconductor layer or a surface of the second oxide semiconductor layer

Methodology Applied
Scientific EffectCrystallization: Crystallisation

Data Source

PatentUS12080720B2Semiconductor device and manufacturing method thereof
Publication Date: 2024.09.03 SEMICON ENERGY LAB CO LTD
  • US12080720B2 patent drawing
  • US12080720B2 patent drawing
  • US12080720B2 patent drawing

AI summary

An object of an embodiment of the present invention is to manufacture a semiconductor device with high display quality and high reliability, which includes a pixel portion and a driver circuit portion capable of high-speed operation over one substrate, using transistors having favorable electric characteristics and high reliability as switching elements. Two kinds of transistors, in each of which an oxide semiconductor layer including a crystalline region on one surface side is used as an active layer, are formed in a driver circuit portion and a pixel portion. Electric characteristics of the transistors can be selected by choosing the position of the gate electrode layer which determines the position of the channel. Thus, a semiconductor device including a driver circuit portion capable of high-speed operation and a pixel portion over one substrate can be manufactured.