Semiconductor Package Interface Layers for Early Stress Detection

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Solution Overview

Problem

Integrated circuits (ICs) in electronic systems face reliability issues due to exposure to harsh environments, leading to potential failures that can cause safety concerns and costly repairs, as existing technologies lack effective methods for detecting degrading subassemblies before complete failure.

Innovation Solution

A semiconductor package with a layer of interface material, such as a polymer or epoxy matrix, that changes its electromagnetic behavior in response to environmental stresses like humidity and heat, allowing for early detection of faults through impedance measurements, which can be stored for comparison and used to replace the component before failure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Duration of action of stationary object

If ICs are packaged in harsh environments for long-term operation, then the electronic system can operate continuously for years or decades, but the subassemblies are subjected to heat, humidity, and mechanical forces that cause degradation and potential failure

Engineering Contradiction:
Improveoperational lifespanVSAvoidsubassembly reliability
Core Design Contradiction:
Duration of action of stationary objectVSReliability

Solution Approach 1:

The patent incorporates a stress sensor layer during the packaging process that continuously monitors stress conditions before complete failure occurs. This preliminary detection mechanism allows for early identification of degradation trends, enabling preventive maintenance or replacement before the subassembly fails completely, thus maintaining reliability over extended operational periods

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The stress sensor provides real-time feedback about the mechanical stress, heat, and humidity conditions experienced by the IC package. This feedback mechanism enables continuous monitoring of the subassembly's health status, allowing the system to detect degradation patterns and take corrective action before failure, thereby resolving the contradiction between long operational duration and maintaining reliability

Inventive Principle:
Principle #23Feedback

2Device complexity

If no stress detection mechanism is implemented, then the package structure remains simple and cost-effective, but failure detection can only occur after complete failure, leading to costly repairs and safety concerns

Engineering Contradiction:
Improvepackage structure complexityVSAvoidfailure detection and replacement
Core Design Contradiction:
Device complexityVSEase of repair

Solution Approach 1:

The patent replaces complex post-failure diagnostic mechanical systems with a simpler integrated stress sensor layer that continuously monitors package integrity. This sensor layer, made of piezoelectric or piezoresistive material, provides automatic electrical signals when stress thresholds are exceeded, eliminating the need for complex external detection equipment and enabling easier, faster repair decisions

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The stress sensor layer is self-integrated into the package structure during manufacturing, requiring no additional external components or complex installation procedures. The sensor automatically monitors stress conditions and provides failure detection capabilities as an inherent part of the package design, reducing overall device complexity while improving ease of repair through early warning signals

Inventive Principle:
Principle #25Self-service

3Ease of manufacture

If traditional packaging materials are used without stress-sensitive properties, then manufacturing remains simple and inexpensive, but early detection of degrading subassemblies is not possible

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidstress and degradation detection
Core Design Contradiction:
Ease of manufactureVSDifficulty of detecting and measuring

Solution Approach 1:

The patent uses composite packaging materials that combine traditional packaging functions with stress-sensing capabilities. The package structure incorporates a layer of piezoelectric or piezoresistive material that responds to mechanical stress, allowing the same manufacturing processes to produce both protective packaging and detection functionality, thus maintaining ease of manufacture while enabling stress detection

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The stress sensor layer serves multiple functions simultaneously: it provides mechanical protection as part of the package structure, acts as a stress detection mechanism, and generates electrical signals for failure warning. This multi-functionality allows traditional manufacturing processes to produce a package that both protects the IC and monitors its own integrity, eliminating the need for separate detection systems

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables early detection of potential failures in ICs, reducing the risk of safety concerns and costly repairs by monitoring changes in impedance over frequency, thereby extending the lifespan and reliability of electronic systems.

Implementation Method 1

the interface material comprising a moisture-sensitive nonconductive material... changes in impedance according to changes in temperature, humidity, or based on a chemical reaction or interaction

Methodology Applied
Scientific EffectImpedance change: Electrical Resistance

Data Source

PatentUS20230307300A1Package layers for stress monitoring and method
Publication Date: 2023.09.28 INTEL CORP
  • US20230307300A1 patent drawing
  • US20230307300A1 patent drawing
  • US20230307300A1 patent drawing

AI summary

A semiconductor package comprises a package substrate comprised of comprised of layers of a first material. The semiconductor package includes an integrated circuit (IC) attached to the substrate at a first surface of the IC through a plurality of vias. The semiconductor package includes at least one interface layer comprised of an interface material different from the first material and sealed from exposure to air. The interface material can comprise a moisture-sensitive nonconductive material and can be disposed within the package substrate or between the first surface of the IC and the package substrate, among other locations. Other systems, apparatuses and methods are described.