Semiconductor Package Substrate Holes for Thermal Stress Relief

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Solution Overview

Problem

Semiconductor packages experience warping or cracking due to mismatched coefficients of thermal expansion (CTEs) of substrate and semiconductor die materials, particularly in larger packages, leading to potential damage of electrical connections and reduced reliability.

Innovation Solution

Incorporation of holes in the substrate, optionally filled with stress buffer layers, to release thermal stress and prevent warping or cracking, combined with a polymer material to compensate for CTE mismatches.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If a relatively large package (50 mm×50 mm or larger) is used, then the electrical connection area and functionality are improved, but the package is highly stressed due to different coefficients of thermal expansion (CTEs) of substrate and semiconductor die materials, leading to warping or cracking

Engineering Contradiction:
Improvepackage areaVSAvoidpackage reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent divides the substrate into multiple segments by forming holes through it. These holes create discrete regions that can independently accommodate thermal expansion differences, preventing stress accumulation across the entire large package area. The substrate is effectively segmented into multiple smaller stress zones, each capable of handling thermal stress independently.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a porous structure into the substrate by forming holes through it. This porous configuration allows the substrate to better accommodate thermal expansion mismatches between the semiconductor die and substrate materials. The holes provide void spaces that can compress or expand during thermal cycling, reducing stress transmission and preventing warping or cracking in large packages.

Inventive Principle:
Principle #31Porous materials

2Stability of the object's composition

If holes are formed in the substrate, then stress is released and warping or cracking is prevented, but the substrate structure becomes more complex

Engineering Contradiction:
Improvesubstrate stabilityVSAvoidsubstrate structure complexity
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The substrate is segmented into multiple regions by forming holes through it. This segmentation creates discrete zones that can independently manage thermal stress, improving overall substrate stability. The holes divide the continuous substrate structure into multiple smaller stable regions, each capable of accommodating local thermal expansion without compromising the entire substrate.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A porous structure is introduced into the substrate by forming holes through it. This porous configuration provides a simple yet effective mechanism for stress relief without requiring complex multi-layer or composite structures. The holes create void spaces that naturally accommodate thermal stress through compression or expansion, maintaining substrate stability with minimal structural complexity.

Inventive Principle:
Principle #31Porous materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances the reliability and lifespan of semiconductor packages by maintaining electrical connections intact and reducing stress-induced damage.

Implementation Method 1

The semiconductor package may be highly stressed due to the different coefficients of thermal expansion (CTEs) of the various substrate and semiconductor die materials

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Implementation Method 2

The semiconductor package may be highly stressed due to the different coefficients of thermal expansion (CTEs) of the various substrate and semiconductor die materials

Methodology Applied
Scientific EffectCoefficient of thermal expansion (CTE) mismatch: Thermal Expansion

Data Source

PatentUS12525549B2Semiconductor package structure
Publication Date: 2026.01.13 MEDIATEK INC
  • US12525549B2 patent drawing
  • US12525549B2 patent drawing
  • US12525549B2 patent drawing

AI summary

A semiconductor package structure includes a base having a first surface and a second surface opposite thereto, wherein the base comprises a wiring structure, a first electronic component disposed over the first surface of the base and electrically coupled to the wiring structure, a second electronic component disposed over the first surface of the base and electrically coupled to the wiring structure, wherein the first electronic component and the second electronic component are separated by a molding material, a first hole and a second hole formed on the second surface of the base, and a frame disposed over the first surface of the base, wherein the frame surrounds the first electronic component and the second electronic component.