Paddle Board Probe Card for High Pin Count ATE Testing
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Solution Overview
Problem
Current flex circuits used in probe cards for ATE systems are limited by their layer count, electrical bandwidth, and mechanical dimensions, restricting signal density and pin count capabilities, which hinders high-speed and high-pin-count applications.
Innovation Solution
The use of paddle boards with printed circuit boards and right-angle connectors, which can support up to 60 layers and wider trace widths, enabling higher signal density and mechanical flexibility, and potentially incorporating active or passive circuitry for fanout of device lines, to create a more effective connection with ZIF connectors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If flex circuits are used to connect probe card to ATE system, then ease of manufacture is improved, but signal density and pin count are limited due to layer count restrictions
Solution Approach 1:
The patent transitions from a two-dimensional flex circuit layout to a three-dimensional paddle board structure with multiple rigid circuit boards stacked and connected at right angles. This dimensional change enables significantly higher layer counts (up to 60 layers) and increased signal density while maintaining manufacturing feasibility through standardized PCB fabrication processes.
2Device complexity
If flex circuits are used for connection, then device complexity is reduced, but electrical bandwidth and mechanical dimensions are limited
Solution Approach 1:
The patent employs a composite structure combining multiple rigid circuit board materials with specific dielectric properties, trace width capabilities, and mechanical characteristics. This composite approach enables higher electrical bandwidth through optimized transmission line characteristics while maintaining manageable device complexity through modular assembly.
3Ease of operation
If traditional connection methods are used, then ease of operation is maintained, but mechanical dimensions and rows of contacts are restricted
Solution Approach 1:
The patent divides the connection structure into segmented rigid circuit boards arranged in a paddle board configuration, with each board section providing specific contact rows. This segmentation enables extended mechanical dimensions and increased contact rows while maintaining ease of operation through modular assembly and standardized connector interfaces.
Data Source
AI summary
A paddle board probe card for connecting a device under test with an ATE tester by means of ZIF connectors is presented. The paddle board probe card may include more than one printed circuit board mounted on a probe card in such a manner that the more than one printed circuit boards mate with ZIF connectors on an ATE testhead interface.