Photoacid Generating Polymer Urethane Linkage Lithography

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Solution Overview

Problem

Current positive-tone photoresist compositions experience diminished image resolution and contrast, particularly in the sub-50 nm regime, due to thermally driven factors such as acid diffusion and reaction propagation, limiting the achievement of higher resolution and smaller feature sizes in semiconductor device patterning.

Innovation Solution

A photoacid generating polymer (PAG polymer) is developed, comprising covalently bound repeat units that include an acid sensitive group, a triarylsulfonium counterion, and a norbornyl ester with specific substituents, which are incorporated into the polymer structure to enhance chemical amplification and reduce acid diffusion during the lithographic process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If chemically amplified photoresists are used to achieve high sensitivity and resolution, then radiation sensitivity and resolution capability are improved, but image blur occurs due to acid diffusion and reaction propagation

Engineering Contradiction:
Improveimage resolutionVSAvoidimage blur
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent introduces a polymer backbone as an intermediary structure to which photoacid generator groups are covalently bound. This polymer mediator holds the acid-generating groups in a fixed spatial arrangement, preventing free diffusion of acid while maintaining the catalytic amplification effect. The polymer acts as a stationary scaffold that enables chemical amplification without the harmful side effect of acid migration, thereby resolving the contradiction between achieving high sensitivity and avoiding image blur.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Stability of the object's composition

If acid sensitive groups are protected to prevent premature dissolution, then solubility control is improved, but acid diffusion during post-exposure bake increases

Engineering Contradiction:
Improvesolubility controlVSAvoidacid diffusion
Core Design Contradiction:
Stability of the object's compositionVSObject-generated harmful factors

Solution Approach 1:

The patent segments the photoresist system into distinct functional modules: acid-sensitive groups attached to polymer chains, photoacid generator groups covalently bound to the polymer backbone, and base soluble groups. This segmentation allows each component to perform its specific function independently. The acid-sensitive groups remain protected during storage and processing, while the covalently bound PAG groups generate acid in situ without diffusing, as they are fixed to the polymer segments. This modular segmentation resolves the contradiction between maintaining solubility stability and preventing acid diffusion.

Inventive Principle:
Principle #1Segmentation

3Manufacturing precision

If smaller feature sizes are targeted for higher resolution patterning, then manufacturing precision is improved, but image blur from thermal diffusion becomes more significant

Engineering Contradiction:
Improvefeature sizeVSAvoidthermal diffusion
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent implements a self-service mechanism where the polymer structure itself provides the containment field for the photoacid generator groups. Each polymer chain serves as its own acid containment vessel, with PAG groups covalently bound and unable to diffuse beyond the polymer chain boundaries. This self-contained architecture eliminates the need for external barriers against thermal diffusion, enabling precise patterning at sub-50 nm feature sizes without image blur from acid migration.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The PAG polymer achieves improved image resolution and contrast, with line/space patterns up to 50% better than conventional materials, allowing for higher resolution patterns down to 22 nm, and maintains solubility differences post-exposure, facilitating effective pattern transfer.

Implementation Method 1

a second repeat unit of formula (2)... wherein Z′3S⊕ is a triarylsulfonium counterion... wherein the second repeat unit is capable of forming the photogenerated acid

Methodology Applied
Scientific EffectPhotoacid generation: Photodissociation

Implementation Method 2

a first repeat unit of formula (1)... wherein the first repeat unit is capable of reacting with a photogenerated acid to form a carboxylic acid containing repeat unit

Methodology Applied
Scientific EffectAcid-catalyzed deprotection: Catalysis

Data Source

PatentUS9851639B2Photoacid generating polymers containing a urethane linkage for lithography
Publication Date: 2017.12.26 CENT GLASS CO LTD
  • US9851639B2 patent drawing
  • US9851639B2 patent drawing
  • US9851639B2 patent drawing

AI summary

A photoacid generating polymer (PAG polymer) comprises i) a first repeat unit of capable of reacting with a photogenerated acid to form a carboxylic acid containing repeat unit, ii) a second repeat unit of capable of forming the photogenerated acid, and iii) a third repeat unit comprising a norbornyl ester, wherein a norbornyl ring of the norbornyl ester comprises a monovalent substituent having the formula *-L′-C(CF3)2(OH). L′ is a divalent linking group comprising at least one carbon and the starred bond of L′ is linked to the norbornyl ring. The first repeat unit, second repeat unit, and the third repeat unit are covalently bound repeat units of the PAG polymer.