Page Buffer ADC Using Thermometer-to-Binary Conversion

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Solution Overview

Problem

Existing analog-to-digital conversion devices have large hardware circuit areas and long operating times, making them inefficient for in-memory computing and in-memory searching applications.

Innovation Solution

The proposed analog-to-digital conversion device includes a sensing circuit to generate a thermometer code representing an analog value and a latch logic circuit to convert this code into a binary code, reducing hardware circuit area and operating time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If flash ADC performs parallel input, then conversion speed is improved, but hardware circuit area increases

Engineering Contradiction:
Improveconversion speedVSAvoidhardware circuit area
Core Design Contradiction:
SpeedVSArea of stationary object

Solution Approach 1:

The parallel flash ADC structure is segmented into multiple sequential stages. Instead of performing all parallel comparisons simultaneously, the converter divides the conversion process into multiple clock cycles where comparisons are performed in sequences, reducing the need for extensive parallel comparator circuits while maintaining acceptable conversion speed.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The ADC employs periodic clocked operations to perform conversions in discrete time intervals. The conversion process is broken down into periodic stages where comparators are enabled in sequences during different clock cycles, allowing the same hardware resources to be reused periodically rather than requiring all comparators to operate simultaneously.

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If TDC performs conversion using flip-flop logical operations, then conversion accuracy is improved, but hardware circuit area increases and operating time lengthens

Engineering Contradiction:
Improveconversion accuracyVSAvoidhardware circuit area
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The mechanical flip-flop based logical operation system is replaced with a voltage-based comparison system. Instead of using sequential flip-flop logic operations to determine binary bits, the invention uses voltage comparators that directly compare the input voltage against reference voltages, eliminating the need for complex flip-flop logic circuits while maintaining conversion accuracy.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The conversion mechanism changes from logical state transitions in flip-flops to direct voltage level comparisons. By changing the fundamental parameter from logical operations to voltage threshold comparisons, the system achieves the same binary conversion function with simpler hardware that requires fewer logical stages and less circuit area.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If SAR type ADC performs complex output storage and reference voltage generation, then conversion accuracy is improved, but device complexity increases

Engineering Contradiction:
Improveconversion accuracyVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The page buffer structure is designed to serve multiple functions simultaneously. It acts as both the output storage register for conversion results and as part of the reference voltage generation system. By making the page buffer multi-functional, the invention eliminates the need for separate dedicated storage and reference voltage generation circuits, thereby reducing overall device complexity while maintaining conversion accuracy.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The output storage function and reference voltage generation function are merged into a single integrated structure. The page buffer that traditionally only stored output data is now combined with reference voltage generation capabilities, reducing the number of separate components and simplifying the overall ADC architecture while preserving the required conversion precision.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS20250158628A1Analog-to-digital conversion device
Publication Date: 2025.05.15 MACRONIX INTERNATIONAL CO LTD
  • US20250158628A1 patent drawing
  • US20250158628A1 patent drawing
  • US20250158628A1 patent drawing

AI summary

An analog-to-digital conversion device, includes the following elements. A sensing circuit, coupled to a bit line of a memory array, and used to sense a current in the bit line to generate a bit-sequence, the bit-sequence has a form of a thermometer code to represent an analog value. A latch logic circuit, including a plurality of latches and a plurality of logic circuits to form a page buffer of the memory array, and used to generate a bit-set according to the bit-sequence, the bit-set has a form of a binary code to represent a digital value. The latches and the logic circuits are used to perform a conversion process to convert the bit-sequence into the bit-set, and the conversion process has a bit width.