Page Buffer Voltage Regulation for Flash Memory Stability

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Solution Overview

Problem

Semiconductor memory devices face challenges in achieving stable and efficient operation due to the limitations in bit line precharging and current sensing mechanisms, which affect the speed and accuracy of read and write operations in nonvolatile memory devices like flash memories.

Innovation Solution

The implementation of a page buffer system that includes a bit line coupling unit, a clamp circuit, a current determination circuit, and a latch circuit, which converts internal voltages to constant potential levels, precharges bit lines, and adjusts output current based on sensed potential levels, thereby stabilizing bit line operations and improving data sensing and storage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If internal voltages are used directly for bit line precharging and current sensing, then the circuit structure is simple, but the operation stability is poor due to potential level fluctuations

Engineering Contradiction:
Improveoperation stabilityVSAvoidcircuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces clamp circuits as intermediary components between the internal voltage generation unit and the bit lines. These clamp circuits regulate the internal voltages to maintain constant potential levels, thereby stabilizing the bit line operations without requiring complete redesign of the voltage generation system.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The clamp circuits dynamically adjust the potential levels of internal voltages to maintain constant output levels. By changing the regulation parameters of the clamp circuits, the system achieves stable bit line precharging and current sensing despite variations in internal voltage generation.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If conventional current sensing mechanisms are used, then the device structure is simple, but the sensing accuracy is insufficient for reliable data detection

Engineering Contradiction:
Improvecurrent sensing accuracyVSAvoidsensing circuit
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent implements a feedback mechanism where the clamp circuit continuously monitors the bit line potential level and adjusts its regulation accordingly. This feedback control ensures that the sensing node maintains an accurate representation of the memory cell state, improving current sensing precision.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The clamp circuit performs preliminary action by precharging the bit lines to constant potential levels before the actual sensing operation. This preconditioning ensures that the bit lines are in a known, stable state, which improves the accuracy of subsequent current sensing during read operations.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If bit lines are not precharged to constant potential levels, then the write operation is faster, but the read operation accuracy deteriorates due to potential level variations

Engineering Contradiction:
Improveread operation accuracyVSAvoidoperation speed
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The clamp circuit performs preliminary precharging of bit lines to constant potential levels before read operations. This ensures that the bit lines start from a known, stable state, which is essential for accurate current sensing and data detection, without significantly impacting the overall operation speed.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enhances the stability and efficiency of semiconductor memory device operations by ensuring consistent bit line precharging and current sensing, leading to improved read and write performance and data integrity.

Implementation Method 1

the clamp circuit may generate a supply voltage by regulating the internal voltage to a constant potential level

Methodology Applied
Scientific EffectVoltage regulation:

Data Source

PatentUS9792966B2Page buffer and semiconductor memory device including the same
Publication Date: 2017.10.17 SK HYNIX INC
  • US9792966B2 patent drawing
  • US9792966B2 patent drawing
  • US9792966B2 patent drawing

AI summary

A semiconductor memory device may include a memory cell array including a plurality of memory cells, and a plurality of page buffers respectively coupled to a plurality of bit lines of the memory cell array, the page buffers being supplied with internal voltages to precharge the plurality of bit lines or to sense an amount of current flowing through the plurality of bit lines, during a sensing operation, wherein each of the page buffers converts the internal voltages into supply voltages having constant potential levels.