PAM-N Signal Characterization Using NRZ Decomposition

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Solution Overview

Problem

Testing and measuring signals with multi-bit symbols based on encoding schemes like PAM-4 are challenging and expensive due to the high cost of specialized equipment for high-speed transceivers.

Innovation Solution

A characterization system that includes a signal detector with conversion units and decoders to generate and analyze signals with fewer discrete pulse amplitudes, using NRZ signal generators and receivers to simulate and test PAM-N signals, reducing costs by leveraging existing low-cost NRZ transmitters and receivers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If specialized equipment is used for testing PAM-N signals, then measurement precision is improved, but device cost increases

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice cost
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent creates a virtual PAM-N signal model by combining multiple NRZ signals through mathematical transformation. Instead of using expensive specialized PAM-N testing equipment, the system generates equivalent test signals using standard NRZ generators and processes the responses through a virtual channel model, achieving the same measurement objectives at lower cost.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The system transforms the testing approach by changing the signal parameters - using binary NRZ signals (2 amplitude levels) instead of multi-level PAM-N signals (N amplitude levels). This parameter transformation allows standard equipment to perform tests that would otherwise require specialized multi-level signal generators and analyzers.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If multi-bit symbols based on PAM-4 encoding are used, then data rate increases, but testing and measuring becomes more challenging

Engineering Contradiction:
Improvedata rateVSAvoidtesting difficulty
Core Design Contradiction:
ProductivityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent segments the multi-level PAM-N signal into multiple binary NRZ signal components. By decomposing the complex N-level signal into simpler 2-level NRZ signals that can be independently generated and analyzed, the system reduces the complexity of testing while maintaining the ability to evaluate high-speed transceiver performance.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system introduces a virtual channel model as an intermediary between the NRZ signal generator and the analysis unit. This virtual model simulates the PAM-N channel characteristics, allowing standard NRZ equipment to indirectly test PAM-N performance through mathematical transformation and signal processing.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS10069663B1System and method for device characterization
Publication Date: 2018.09.04 XILINX INC
  • US10069663B1 patent drawing
  • US10069663B1 patent drawing
  • US10069663B1 patent drawing

AI summary

A characterization system includes a signal detector. The signal detector includes a first conversion unit configured to receive, from a first device, a first device output signal including N possible discrete pulse amplitudes and generate a plurality of detected signals based on a plurality of threshold amplitudes respectively. The signal detector further includes a second conversion unit configured to generate a first conversion output signal and a second conversion output signal based on logic values included in the plurality of detected signals and provide first and second conversion output signals to an analysis unit for generating one or more measurements of the first device. The first and second conversion output signals include M1 and M2 possible discrete pulse amplitudes respectively. M1 and M2 are integers less than N.