Panel Defect Detection Circuit Using Gate Driving Signals
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Solution Overview
Problem
Detecting panel defects in display devices is challenging due to the complexity of existing methods and the need for separate algorithms or expensive equipment, especially when dealing with simple sub-pixel structures.
Innovation Solution
A display device with a panel defect detection circuit that uses signals related to gate driving, such as clock signals or gate signals, to identify defects by generating a test result signal based on the comparison with a reference signal, allowing for accurate detection without a separate panel defect detection algorithm, and determining the presence of defects based on the number and length of high-level voltage periods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a separate panel defect detection algorithm or expensive detection equipment is used, then panel defect detection capability is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The gate driving circuit performs defect detection using its own internal signals (gate signals and clock signals) without requiring external detection equipment or separate detection algorithms. The circuit self-tests by comparing its output signals against reference signals generated within the same circuit, thereby achieving defect detection capability while maintaining simplicity.
Solution Approach 2:
The gate driving circuit is designed to serve multiple functions: it not only drives the gate lines of the display panel but also performs panel defect detection using its internal signals. This multi-functionality eliminates the need for separate detection equipment and reduces overall system complexity while maintaining detection accuracy.
2Measurement precision
If a complex sub-pixel structure is added for defect detection, then panel defect detection capability is improved, but manufacturing complexity increases
Solution Approach 1:
The patent utilizes existing signals already present in the gate driving circuit (gate signals and clock signals) for defect detection purposes, rather than adding separate detection structures in the sub-pixels. This approach achieves detection capability without modifying the sub-pixel structure, thereby maintaining ease of manufacture.
3Measurement precision
If separate detection equipment is used for panel defect detection, then detection accuracy is improved, but power consumption increases
Solution Approach 1:
The gate driving circuit performs defect detection using its own internal signals without requiring external detection equipment. This self-service approach eliminates the additional power consumption that would be associated with separate detection devices, while maintaining accurate defect detection through signal comparison.
Data Source
AI summary
Embodiments of the present disclosure relate to a display device, panel defect detection circuit and panel defect detection method. In particular, panel defect detection circuit may detect a panel defect of a display panel by using a signal input to a gate driving circuit or a signal output from the gate driving circuit as a test signal, and a reference signal, thereby detecting the panel defects using signals related to gate driving without using a separate panel defect detection algorithm.