Defect Detection in Ultra-High Resolution Panels Using Field Superimposition
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Solution Overview
Problem
Existing automated electrical circuit inspection systems face challenges in accurately distinguishing between the locations of individual conductors and detecting defects due to insufficient spatial resolution, especially in high-resolution flat panel displays with closely spaced conductors.
Innovation Solution
A system that applies different electrical voltages to conductors such that the overall superimposition of electrical fields is zero in the absence of defects and non-zero in their presence, using an electric field or electro-optical sensor to detect defects and provide a human-visual indication of their location, allowing for effective defect detection without requiring high spatial resolution from the sensor.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a sensor with high spatial resolution is used to distinguish individual conductor locations, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent changes the measurement parameter from spatial position to electrical field intensity. Instead of using a high-resolution sensor to detect the position of each conductor, the system applies different electrical voltages to conductors and measures the resulting electrical field superimposition with a low-resolution sensor, thereby resolving the contradiction between measurement precision and device complexity
Solution Approach 2:
The patent replaces the mechanical/optical measurement system (high-resolution spatial sensor) with an electrical measurement system (electrical field sensor). By substituting the measurement domain from spatial to electrical, the system achieves equivalent defect detection capability without requiring high spatial resolution, thus reducing device complexity
2Device complexity
If conventional inspection methods are used with sensors lacking spatial resolution, then device complexity is reduced, but measurement precision deteriorates
Solution Approach 1:
The patent transforms the measurement parameter from spatial domain to electrical domain. By measuring electrical field superimposition patterns rather than spatial positions, the system enables accurate defect detection using simple low-resolution sensors, thereby improving measurement precision without increasing device complexity
Solution Approach 2:
The patent introduces electrical field patterns as an intermediary between the conductors and the sensor. The electrical fields act as a mediator that translates conductor defects into detectable signal variations, allowing simple sensors to achieve high measurement precision through the intermediary electrical field measurements
3Reliability
If different electrical voltages are applied to conductors to enable defect detection, then defect detection sensitivity is improved, but use of energy increases
Solution Approach 1:
The patent employs periodic application of different electrical voltages to the conductors in a systematic sequence. By applying voltages periodically and measuring the resulting electrical field patterns at each step, the system achieves high defect detection sensitivity while controlling energy consumption through structured, intermittent voltage application rather than continuous high-power operation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection and localization of defects in electrical circuits with improved sensitivity and specificity, even in high-resolution displays with closely spaced conductors, by utilizing a sensor that can sense the overall superimposed electric fields rather than individual conductor locations.
Implementation Method 1
the voltage driver applies the different electrical voltages which are selected such that the overall superimposition of the electrical fields at the test region is zero in the absence of defects in the plurality of conductors
Implementation Method 2
a sensor operative to sense at least one characteristic of a test region defined thereby with respect to the electrical circuits, the sensor lacking sufficient spatial resolution to distinguish between the locations of individual ones of the plurality of conductors
Data Source
AI summary
A system for inspection of electrical circuits, which electrical circuits include a multiplicity of conductors which are mutually spaced from each other, the system including a voltage driver operative to apply different electrical voltages to a plurality of conductors from among the multiplicity of conductors, which plurality of conductors are in spatial propinquity to each other, a sensor operative to sense at least one characteristic of a test region defined thereby with respect to the electrical circuits, the sensor lacking sufficient spatial resolution to distinguish between the locations of individual ones of the plurality of conductors and a defect indicator responsive to at least one output of the sensor for ascertaining whether a defect exists in the plurality of conductors.