3D Panel Edge Defect Monitoring for Machining Feedback
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Solution Overview
Problem
Current methods for detecting defects in industrially processed panel edges rely on visual evaluation or complex optical systems, lacking an effective and simple automated solution for identifying anomalies such as parallelism, linearity, and shaping errors.
Innovation Solution
A system comprising a measuring device and control unit that performs three-dimensional profile measurements of panel edges, detecting defects and providing feedback to processing machines to optimize parameters and reduce errors, integrated with an IoT platform for data analytics and maintenance suggestions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If visual evaluation by specialized operators is used, then defect detection is possible, but the process is qualitative and dependent on operator experience
Solution Approach 1:
The patent replaces the mechanical/visual inspection system operated by human specialists with an automated optical measurement system. The system uses a laser scanner or camera to capture three-dimensional data of the panel edge, automatically processing the geometry to detect defects such as gaps, protrusions, and irregularities in the applied edge banding.
Solution Approach 2:
The patent creates a digital three-dimensional copy of the panel edge geometry through optical scanning. This digital model is then analyzed by processing circuitry to identify defects, replacing the need for physical visual inspection while preserving and enhancing the detection capability.
2Extent of automation
If optical systems based on image processing are used, then automated defect verification is possible, but the systems are rather complex and do not provide comprehensive defect indications
Solution Approach 1:
The patent replaces complex optical image processing systems with a simplified three-dimensional measurement approach using laser scanning or structured light projection. This method directly captures geometric data that is inherently suited for detecting edge defects, eliminating the need for complex image analysis algorithms while providing more comprehensive defect information.
Solution Approach 2:
The patent transitions from two-dimensional image processing to three-dimensional geometric measurement. By capturing the edge geometry in three dimensions, the system can detect defects more effectively and with simpler processing, as the additional dimensional information provides direct insight into geometric deviations without requiring complex image analysis.
3Loss of information
If three-dimensional profile measurements are performed, then automated defect detection with comprehensive indications is achieved, but measurement and system complexity increases
Solution Approach 1:
The patent employs a universal three-dimensional measurement system that can detect multiple types of defects (gaps, protrusions, irregularities, parallelism errors, linearity errors) using a single measurement approach. The same laser scanner or camera setup and processing algorithm handle all defect types, providing comprehensive information without requiring multiple specialized detection systems.
Data Source
Figure 1~2B
Figure 2C~4
Figure 3
AI summary
A system (10) for monitoring defects of edges (2) of panels (1) obtained by industrial processing by means of a machine tool (20) is provided with: a measuring device (12), which performs a dimensional measurement of an edge-panel system (14), formed by a panel (1) on which an edge (2) has been applied to close a lateral surface thereof; a control unit (16), operatively coupled to the measuring device (12) and receiving dimensional measurement data from the measuring device (12) and processing said dimensional measurement data to determine information concerning defects associated with the edge-panel system (14). The control unit (16) provides the processed information concerning the defects associated with the edge-panel system (14) to the machine tool (20), in order to optimize, according to these information, processing parameters of the panels (1) and of the respective edges (2) and thus reduce processing errors.