Panel Inspection Using Multiple Optical Probes for Flicker Accuracy
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Solution Overview
Problem
The existing panel inspection method using a host with a single optical probe inaccurately measures flicker values due to probe errors or connection issues, leading to severe product flicker and reduced production yield.
Innovation Solution
A panel inspection method employing a host connected to multiple optical probes via USB cables, which inspect and compare flicker values to determine optimal common electrode voltages, adjusting inputs until accurate measurements are obtained, and implementing a two-step verification process to ensure data accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single optical probe is used to inspect flicker values, then the inspection process is simple, but the measurement accuracy deteriorates due to probe errors or connection issues
Solution Approach 1:
The patent divides the single probe inspection function into multiple probes working in parallel. Each probe independently inspects flicker values of panels, and the system collects inspection results from multiple probes to determine optimal common electrode voltages. This segmentation eliminates the single point of failure and improves measurement reliability.
Solution Approach 2:
The patent implements a feedback mechanism where multiple probes provide inspection results that are fed back to the host system. The host system processes this feedback data to determine optimal common electrode voltages and adjusts the voltage settings accordingly. This closed-loop feedback ensures accurate measurement despite individual probe variations.
2Measurement precision
If multiple optical probes are used to improve measurement accuracy, then the measurement precision improves, but the device complexity increases
Solution Approach 1:
The patent designs the host system to perform multiple functions: it controls multiple optical probes, collects inspection results from all probes, processes the collected data to determine optimal common electrode voltages, and adjusts voltage settings. This multi-functional host system manages the complexity of having multiple probes while providing comprehensive inspection capabilities.
Solution Approach 2:
The patent merges the functions of multiple probes and the host system into an integrated inspection system. The probes are connected to the host through USB cables, and the host consolidates the inspection results from all probes to make unified decisions about optimal voltage settings. This merging approach manages complexity by providing centralized control.
3Reliability
If VCOM adjustment is performed to optimize panel flicker, then the flicker performance improves, but the production time increases due to iterative adjustments
Solution Approach 1:
The patent performs preliminary actions by having multiple probes simultaneously inspect flicker values and collect inspection results before determining the optimal common electrode voltage. This preliminary data collection from multiple sources enables the system to make informed decisions more efficiently, reducing the need for iterative adjustments and speeding up the optimization process.
Solution Approach 2:
The patent maintains continuous useful action by having multiple probes continuously inspect flicker values and provide real-time feedback to the host system. This continuous flow of inspection data allows the system to quickly determine optimal voltage settings without interrupting the production flow, thereby maintaining high productivity while achieving good flicker performance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method improves the accuracy of flicker value measurements, reducing product flicker and enhancing production yield by avoiding abnormalities caused by probe issues or connection problems.
Implementation Method 1
providing a host and an optical probe set, where the optical probe set includes at least two optical probes, and the optical probes are connected to the host through USB cables, for inspecting flicker values of the panels
Data Source
AI summary
A panel inspection method is provided, including: S10: providing a host and at least two optical probes; S20: sending, by the host, a lighting command and inputting a common electrode voltage to the panel group; S30: inspecting, by each of the optical probes, respectively a flicker value of any panel in the panel group and returning the value to the host; S40: determining, by the host, whether the flicker value is an optimal flicker value.