Display Panel Test Pad Structure for Narrow Data Line Inspection
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Solution Overview
Problem
The narrow spacing between data lines in high-definition display panels makes it difficult to apply inspection signals using conventional probes during the open/short test, complicating defect detection.
Innovation Solution
The implementation of first and second test parts, each comprising test lines and pads, which are strategically positioned to facilitate effective inspection of data lines, allowing for accurate detection of defects without interfering with the display panel's definition.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If the distance between data lines is narrowed to achieve high definition, then the definition of the display panel is improved, but the application of inspection signals using probes becomes difficult
Solution Approach 1:
The patent introduces test lines extending in the first direction (perpendicular to the second direction where data lines are arranged) and positions test pads at extreme ends of the display panel. This dimensional change allows inspection equipment to access data lines from the edge of the panel rather than requiring direct probe contact between closely spaced data lines, thereby enabling inspection of high-definition panels with narrowed data line distances.
Solution Approach 2:
The patent introduces test lines and test pads as intermediary elements between the inspection equipment and the data lines. These test lines extend from the data lines to the edge of the display panel, where test pads are formed, allowing inspection signals to be applied indirectly through the test pads rather than requiring direct probe contact with the closely spaced data lines.
2Measurement precision
If test lines and test pads are added for inspection, then defect detection capability is improved, but the structure of the display panel becomes more complex
Solution Approach 1:
The patent merges the test lines with the existing data lines by forming test lines that extend from the data lines in the same layer. The test pads are merged with the pixel electrodes or common electrodes structure at the edge of the display panel. This integration approach adds inspection functionality without creating completely separate test structures, thereby minimizing the increase in overall structural complexity.
Solution Approach 2:
The test pads formed at the extreme ends of the display panel serve multiple functions: they act as connection points for the test lines, provide access points for inspection equipment, and can be integrated with the pixel electrode or common electrode structures. This multi-functionality reduces the need for additional dedicated test structures, thereby limiting the increase in device complexity.
Data Source
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AI summary
A display device includes a plurality of pixel rows, a first data line, a second data line, a data driver, a first test part, and a second test part. Each of the plurality of pixel rows includes a plurality of pixels. The first data line is disposed between two adjacent pixel rows among the a plurality of pixel rows. The second data line is disposed between the two adjacent pixel rows. The data driver is configured to provide at least one data signal to the first data line and the second data line. The first test part is connected to one of the first data line and the second data line, and is disposed between the plurality of pixel rows and the data driver. The second test part is electrically connected to the other of the first data line and the second data line.