Panelized PCB Characterization Vehicle for Manufacturing Sensitivity

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Solution Overview

Problem

Conventional characterization vehicles for printed circuit boards lack effective methods to systematically evaluate and optimize manufacturing processes across different factories, leading to factory-to-factory instability and variability in component functionality due to varying design parameters.

Innovation Solution

A characterization vehicle comprising two test circuits on separate panels of a panelized printed circuit board, each with distinct design parameters chosen according to a design of experiment (DOE), allowing for the evaluation of manufacturing process sensitivity and factory maturity by comparing functional yields and performance under various design rule violations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional characterization vehicles use a single test circuit design, then manufacturing simplicity is maintained, but factory-to-factory variability and sensitivity to design parameters cannot be systematically evaluated

Engineering Contradiction:
Improvefunctional yield consistencyVSAvoidtest circuit design variation
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The characterization vehicle is segmented into multiple test circuits (first test circuit and second test circuit) with different design parameters. Each test circuit is designed according to a specific set of design parameters from a design of experiment (DOE), allowing systematic evaluation of manufacturing process sensitivity to different design variations while maintaining a unified test vehicle structure.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If design parameters are varied across test circuits to evaluate manufacturing sensitivity, then manufacturing process optimization is improved, but test program complexity and evaluation difficulty increase

Engineering Contradiction:
Improveprocess sensitivity evaluationVSAvoidfunctional yield comparison
Core Design Contradiction:
Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

Different test circuits are assigned different local design qualities - specifically, different design parameters from a DOE (such as minimum trace spacing, trace width, flood fill rules, or decoupling capacitor density). This allows each test circuit to probe specific aspects of manufacturing sensitivity while the overall characterization vehicle maintains a consistent evaluation framework through standardized test programs.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If multiple design parameters are tested simultaneously, then comprehensive manufacturing evaluation is achieved, but control over individual parameter effects becomes difficult

Engineering Contradiction:
Improvedesign parameter sensitivityVSAvoiddesign parameter management
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The design of experiment (DOE) is performed in advance to pre-determine the set of design parameters and their combinations. This preliminary action structures the test circuits before fabrication, ensuring that each test circuit targets specific design parameters systematically. The DOE framework provides a controlled methodology for evaluating multiple parameters while maintaining the ability to isolate and analyze individual parameter effects.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10897814B2Characterization vehicles for printed circuit board and system design
Publication Date: 2021.01.19 PDF SOLUTIONS INC
  • US10897814B2 patent drawing
  • US10897814B2 patent drawing
  • US10897814B2 patent drawing

AI summary

A characterization vehicle may include a first test circuit and a second test circuit located on separate panels of a panelized printed circuit (PC) board. The first test circuit may be fabricated in accordance with a first plurality of design parameters. The second test circuit may be fabricated in accordance with a second plurality of design parameters. The first plurality of design parameters and the second plurality of design parameters may be chosen in accordance with a design of experiment (DOE) concerning one or more design rules or design trade-offs such that at least two corresponding design parameters from the first and second test circuits have identical values, and at least two corresponding design parameters from the first and second test circuits have different values.