Parallel Accelerated Testing for Multi-Stress Component Life Evaluation

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Solution Overview

Problem

Conventional accelerated test methods apply a single stress to multiple components, failing to account for the diversity of component sensitive stress types and stress limits, resulting in inefficient testing and significant errors.

Innovation Solution

A parallel accelerated test method that separately applies multiple sensitive stresses to multiple components by determining individual stress types and limits for each component, correcting stress values based on an overall product acceleration coefficient, and deploying components in coordinated test boxes to perform simultaneous testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single stress is applied to multiple components in conventional accelerated testing, then the testing process is simplified, but the testing accuracy and reliability deteriorate due to ignoring component diversity in sensitive stress types and stress limits

Engineering Contradiction:
Improvetesting process complexityVSAvoidtesting accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the testing process by dividing components into different groups based on their sensitive stress types. Each group is assigned to a dedicated test box that applies the corresponding stress type (temperature, humidity, vibration, etc.). This segmentation allows each test box to specialize in testing specific component types with matching stress characteristics, thereby improving testing accuracy while maintaining manageable system complexity through modular architecture.

Inventive Principle:
Principle #1Segmentation

2Ease of operation

If a single stress is applied to multiple components, then the testing operation is easier to manage, but the productivity and testing efficiency deteriorate due to inability to maximize acceleration effects for different component types

Engineering Contradiction:
Improvetesting operation easeVSAvoidtesting efficiency
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The patent implements dynamic stress application by allowing each test box to independently apply different stress types and stress levels according to the specific requirements of the components being tested. The system dynamically adjusts stress parameters (temperature, humidity, vibration intensity) based on component characteristics and acceleration coefficients, maximizing the acceleration effect for each component type while maintaining ease of operation through automated control.

Inventive Principle:
Principle #15Dynamics

3Device complexity

If conventional accelerated testing is used with single stress application, then the testing setup is simpler, but the testing time increases due to significant errors requiring repetitive tests

Engineering Contradiction:
Improvetesting setup complexityVSAvoidtesting time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The patent performs preliminary classification of components according to their sensitive stress types before testing begins. This preliminary action ensures that each component is placed in the appropriate test box with the correct stress type from the outset, eliminating the need for repetitive tests caused by mismatched stress applications. The system pre-calculates acceleration coefficients and determines optimal stress levels for each component type, thereby reducing total testing time without significantly increasing setup complexity.

Inventive Principle:
Principle #10Preliminary action

4Device complexity

If single stress testing is applied to multiple components, then the testing system is less complex, but the product life evaluation accuracy deteriorates due to significant errors in acceleration effects

Engineering Contradiction:
Improvetesting system complexityVSAvoidproduct life evaluation accuracy
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies local quality by tailoring the stress conditions in each test box to match the specific requirements of the components being tested. Each test box provides a localized testing environment with optimized stress type and level for its assigned component group. This localized approach ensures that acceleration effects are accurately applied to each component type, significantly improving product life evaluation accuracy while maintaining reasonable system complexity through modular design.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12493070B2Parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components
Publication Date: 2025.12.09 CHINA ELECTRONICS RELIABILITY AND ENVIRONMENTAL TESTING INSTITUTE ((THE FIFTH INSTITUTE OF ELECTRONICS MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY) (CHINA SAIBAO LABORATORY)
  • US12493070B2 patent drawing
  • US12493070B2 patent drawing
  • US12493070B2 patent drawing

AI summary

Disclosed are a parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple components. Sensitive stress types of different product components are determined respectively, and accelerated test stress values of the different product components are determined respectively based on the sensitive stress types. The overall product acceleration coefficient is determined, the accelerated test stress values of different product components are corrected based on the overall product acceleration coefficient, and the multi-box coordinated deployment scheme is determined based on the sensitive stress types of different product components and the corrected stress values in accelerated test. Based on an accelerated test confidence level and product failure count threshold, a target accelerated test scheme is determined from candidate accelerated test schemes. Under the multi-box coordinated deployment scheme, the target accelerated test scheme is executed in parallel on different product components to obtain a product life evaluation result.