Parallel ADC Reference Correction for Reliable Sensor Conversion
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing analog-to-digital (A/D) conversion systems face reliability issues when multiple A/D converters with different reference voltages perform conversions in parallel, leading to deviations in digital signal values due to noise and impedance limitations, which affect the accuracy of sensor measurements.
Innovation Solution
The system employs a configuration where each A/D converter receives a reference low voltage or current from a separate power supply, allowing for correction of digital signals based on variation amounts to maintain consistent relative deviations, using step-down or step-up circuits with active or passive elements to generate these reference levels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple A/D converters with different reference voltages perform conversions in parallel, then conversion speed and productivity are improved, but reliability and measurement precision deteriorate due to noise and impedance variations
Solution Approach 1:
The patent introduces a reference low voltage (lower than the main reference voltage) that is commonly supplied to all A/D converters. By changing the voltage parameter to a lower, more stable reference level and using it across all converters, the system maintains consistent conversion reliability while allowing parallel operation at high speed
Solution Approach 2:
The reference low voltage acts as an intermediary between the high-voltage reference sources and the A/D converters. Instead of directly connecting converters to different high-voltage references (which causes noise and impedance issues), the reference low voltage mediates by providing a unified, stable reference level that all converters use, thereby ensuring reliability
2Adaptability or versatility
If a voltage divider circuit is provided in the sensor to handle reference voltages, then adaptability to different reference levels is improved, but input impedance is limited to low levels and measurement precision deteriorates
Solution Approach 1:
The patent extracts the voltage division function from the sensor and relocates it to a separate reference low power supply circuit. This removes the harmful voltage divider from the sensor path, thereby maintaining high input impedance and measurement precision while still providing the necessary reference low voltage to the A/D converters
3Ease of manufacture
If wires connect reference voltages of A/D converters and sensor, then ease of manufacture is improved, but noise interference increases and reliability deteriorates
Solution Approach 1:
The patent creates an equipotential reference system by providing a common reference low voltage to all A/D converters and the sensor. This equalizes the reference potential across all components, eliminating potential differences that would cause noise and interference, while maintaining simple wiring through the unified reference connection
Data Source
AI summary
An analog-to-digital conversion system includes: a first conversion device configured to communicate with a first analog-to-digital converter configured to convert a first analog signal into a first digital signal; a second conversion device configured to communicate with a second analog-to-digital converter configured to convert a second analog signal into a second digital signal; a first reference low power supply; and a second reference low power supply. The first conversion device is configured to correct the first digital signal, based on a variation amount of a second reference low voltage or a second reference low current. The second conversion device is configured to correct the second digital signal, based on a variation amount of a first reference low voltage or a first reference low current.