Parallel Axis Measuring Assembly for Workpiece Contour Accuracy
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Solution Overview
Problem
Existing measuring assemblies for workpiece contours face challenges in achieving high accuracy due to misalignment of axes, requiring precise geometry adjustments and being unsuitable for measuring circumferential contours, which results in systematic errors and increased costs.
Innovation Solution
A measuring assembly with a pivot lever probe that radially contacts the workpiece surface, where the measuring axis is parallel to the workpiece axis, allowing rotation of the probe and workpiece relative to each other to reconstruct the contour, reducing the need for precise axis alignment and enabling high accuracy measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the measuring axis is perpendicular to the workpiece axis (conventional configuration), then the measuring probe can contact the workpiece surface, but systematic measuring errors occur due to misalignment and axis wobbling
Solution Approach 1:
The patent inverts the conventional perpendicular axis configuration to a parallel axis configuration. The measuring axis (first axis) of the pivot lever probe is arranged parallel to the workpiece axis (second axis), creating an asymmetric measurement geometry that eliminates systematic errors caused by axis misalignment and wobbling during rotation.
2Measurement precision
If precise alignment of measuring axis and workpiece axis is performed, then measuring accuracy is improved, but measurement time and cost increase
Solution Approach 1:
The parallel axis configuration enables the measurement system to be self-aligning. Since both axes are parallel, the measuring probe automatically maintains correct geometric relationship with the workpiece during rotation without requiring time-consuming manual alignment operations, making the system self-sufficient for accurate measurement.
3Adaptability or versatility
If the probe arm is bent to adjust normal position for reaching difficult measuring points, then accessibility is improved, but long-term geometry stability deteriorates
Solution Approach 1:
The patent employs a pivot lever probe with a pivotably supported measuring arm that can dynamically adjust its position. The measuring arm can pivot about the measuring axis to reach difficult-to-access measuring points on the workpiece surface, while the pivot mechanism maintains stable and repeatable geometry through controlled angular movement rather than permanent bending.
Data Source
AI summary
A measuring assembly for measuring the contour of a workpiece has a measuring probe that is pivotably supported and deflectable about a first axis (measuring axis) in order to contact a surface of the workpiece, and has a second axis that is associated with the workpiece. The first axis and the second axis are parallel or approximately parallel to one another for radially contacting a surface of the workpiece. A device for rotating the measuring probe and the workpiece relative to one another is provided, such that the measuring probe contacts the surface of the workpiece during the rotation, and a device for plotting the angular deflection of the measuring probe as a function of the particular rotational position of the workpiece relative to the measuring probe is provided.