Parallel Communication Device Testing via Dynamic Scheduling
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Solution Overview
Problem
Conventional testing devices for communication devices can only test one device at a time, leading to inefficient testing due to the need for sequential coupling and testing, which cannot meet the demands of modern communication devices with complex protocols and varied test characteristics.
Innovation Solution
A testing device with a connecting module and processor that allows simultaneous electrical coupling with multiple communication devices and determines a schedule for alternate testing, using time domain, frequency domain, or time-frequency domain schedules to optimize testing efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a conventional testing device tests communication devices one at a time sequentially, then the device structure remains simple, but the testing time increases linearly with the number of devices
Solution Approach 1:
The testing device is segmented into multiple independent testing modules, each capable of testing one communication device simultaneously. This segmentation allows parallel processing of multiple devices, transforming the linear sequential testing into concurrent parallel testing, thereby reducing total testing time while maintaining simple individual module structures
Solution Approach 2:
The invention transitions from single-device sequential testing to multi-device parallel testing by adding a dimensional aspect of simultaneous operation. The testing system operates across multiple time slots and device instances, creating a two-dimensional testing matrix that significantly reduces total testing duration
2Productivity
If a conventional testing device couples with multiple communication devices individually, then the electrical coupling structure remains simple, but the testing process becomes time-consuming
Solution Approach 1:
Multiple electrical coupling connections are merged into a single integrated coupling structure that can simultaneously connect to multiple communication devices. This combining approach allows the testing device to establish connections with all devices in parallel, eliminating the sequential coupling time penalty while maintaining simple individual connection interfaces
3Adaptability or versatility
If the testing device tests all communication devices before moving to the next device, then the testing process is straightforward, but the testing schedule cannot be optimized
Solution Approach 1:
The testing schedule is made dynamic and adaptable rather than fixed. The system can dynamically adjust the testing sequence, allocate time slots flexibly, and optimize the testing schedule based on device characteristics and test requirements. This dynamic scheduling allows for optimized testing durations while maintaining versatility across different device types
Solution Approach 2:
The testing schedule is prepared in advance with predetermined time slots and sequences for multiple devices. This preliminary scheduling allows the system to optimize the testing duration by pre-arranging efficient test sequences, while still maintaining the flexibility to adapt to different device characteristics through pre-configured scheduling templates
Data Source
AI summary
A testing device includes a connecting module and a processor electrically connected to the connecting module. The connecting module is electrically coupled with a plurality of communication devices under tests (DUTs) synchronously. The processor determines a schedule for the communication DUTs and tests the communication DUTs according to the schedule. A testing method is applied to the testing device to implement the operations.