Parallel Contact Endurance Testing With Shared Load Switching

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Solution Overview

Problem

Existing electrical endurance testing of relays and switches is time-consuming, resource-intensive, and requires significant lab equipment and footprint, limiting the ability to test multiple samples efficiently and flexibly.

Innovation Solution

A parallel electrical endurance testing system using a control system, controller, oven, electrical loads, and multiplexing relays to test multiple samples simultaneously, reducing testing time and resource usage while allowing for different test types on the same equipment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional sequential electrical endurance testing is used, then testing accuracy and reliability are maintained, but testing time and resource consumption are excessive

Engineering Contradiction:
Improvetesting throughputVSAvoidtesting duration
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The testing system is segmented into multiple independent test channels, each capable of testing a separate sample simultaneously. The test fixture includes multiple sets of contacts and control circuits that can operate in parallel, allowing multiple endurance tests to be conducted at the same time rather than sequentially.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Multiple test channels are merged into a single integrated testing system that shares common control electronics, power supply, and data acquisition resources. This allows parallel testing while reducing overall resource consumption compared to having separate testing equipment for each sample.

Inventive Principle:
Principle #5Merging (Combining)

2Productivity

If multiple test equipment are used to test multiple samples, then testing parallelism is achieved, but lab footprint and equipment complexity increase

Engineering Contradiction:
Improvenumber of samples tested simultaneouslyVSAvoidnumber of equipment pieces
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The testing system is designed with universal components that can handle multiple test configurations. The control system can accommodate different sample types and test parameters through programmable settings, allowing the same equipment to perform various endurance tests without requiring specialized equipment for each test type.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

A central control system acts as an intermediary between the multiple test channels and the user interface. This mediator coordinates the parallel testing operations, manages data acquisition from all channels, and provides unified control, thereby reducing the complexity that would otherwise arise from managing multiple independent test systems.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If traditional testing methods are used, then equipment requirements are met, but resource consumption and testing cost are high

Engineering Contradiction:
Improvetest result accuracyVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The parallel testing system maintains continuous useful action by keeping multiple test channels operating simultaneously rather than having equipment idle between sequential tests. This continuous operation optimizes the utilization of power and resources while maintaining accurate test results through proper thermal management and stable operating conditions.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS12540976B2Systems and methods for parallel electrical endurance testing of contacts
Publication Date: 2026.02.03 UL LLC
  • US12540976B2 patent drawing
  • US12540976B2 patent drawing
  • US12540976B2 patent drawing

AI summary

An apparatus for testing a plurality of electrical switches including contacts to connect multiple sample switches to an input and an output. A power source is connected to the inputs of the sample switches, and other switches are connected to the outputs of the sample switches so that the sample switches may be selectively connected to either a make load or a break load to perform testing on the sample switches. The sample switches may further be made of silicon carbide MOSFETs that shutoff using a zero-crossing current sensing logic. The voltage at the sample switches may further be monitored by a universal voltage board configured to sense various alternating and direct current (AC or DC) voltages so that various types of sample switches may be tested.