Parallel Error Rate Testing for Multiple Devices and Frequencies
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Solution Overview
Problem
Measuring bit error rates (BER) smaller than 10−6 requires a large number of bits to be measured, leading to excessively long measurement durations due to the exponential scaling of measurement time with the integer n, making it inefficient for characterizing device performance.
Innovation Solution
The error rate test method parallelizes the testing process by simultaneously testing multiple devices under test and/or multiple different predetermined frequencies, allowing for simultaneous error rate evaluation across various frequency bands, reducing the overall measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sequential testing of multiple devices and frequencies is performed, then measurement precision is maintained, but measurement time becomes excessively long
Solution Approach 1:
The patent combines multiple test signals with different frequencies into a single composite test signal that can be transmitted simultaneously to multiple devices under test. This merging approach allows parallel measurement of bit error rates across multiple devices and frequency bands without requiring sequential testing, thereby reducing measurement time while maintaining statistical accuracy through sufficient total sample size
Solution Approach 2:
The patent introduces frequency diversity as an additional dimension for parallel testing. By allocating different frequency bands to different devices or test groups, the system transforms a single-dimensional sequential testing process into a multi-dimensional parallel process, where measurements occur simultaneously across multiple frequency dimensions rather than one after another
2Measurement precision
If a large number of bits are measured to achieve small bit error rates, then measurement precision improves, but productivity decreases
Solution Approach 1:
The patent segments the overall measurement task by dividing it into multiple parallel measurement channels, each handling a portion of the total devices or frequency bands. Each segment processes a sufficient number of bits to achieve the required precision for small bit error rates, but because segments operate simultaneously rather than sequentially, the overall productivity increases while maintaining the necessary measurement precision for detecting small error rates
Data Source
AI summary
An error rate test method is disclosed. The error rate test method comprises the following steps. At least one test signal with a predetermined frequency is received from at least one device under test. A symbol sequence comprised in the at least one test signal is determined. At least one error quantity being associated with the at least one device under test and the at least one test signal is determined based on the determined symbol sequence, wherein the at least one error quantity determined is indicative of a rate of erroneous symbols comprised in the symbol sequence. Respective error quantities are determined simultaneously for at least one of multiple devices under test and for multiple different predetermined frequencies. Further, a test system for testing a device under test is disclosed.