Parallel Memory Socket Test Board for Multi-Rank Efficiency
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The high cost and time required for testing semiconductor devices under real usage conditions, especially for memory modules with increased capacity, make accurate testing difficult and inefficient.
Innovation Solution
A memory mounting test system with a main board that includes sockets connected parallel to the substrate, a central processing unit, memory controller, and input/output control circuits, allowing for the application of address, control, and data signals to perform a mounting test by treating memory modules with multiple ranks as single ranks during the testing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If memory modules with multiple ranks are tested under real usage conditions, then testing accuracy is improved, but testing time and cost increase
Solution Approach 1:
The patent changes the operational parameters of the memory module during testing by configuring multi-rank memory modules to operate in single-rank mode. This is achieved by controlling the memory controller to access only one rank at a time, thereby simplifying the test configuration while maintaining realistic operating conditions. This parameter change reduces testing complexity and time while preserving testing accuracy for the most common usage scenario.
2Measurement precision
If memory modules with multiple ranks are tested under real usage conditions, then testing accuracy is improved, but testing cost increases
Solution Approach 1:
The patent reduces testing cost by changing the operational parameters to single-rank mode during testing. This simplification reduces the complexity of test equipment requirements, shortens test cycle times, and lowers overall testing costs while still providing accurate results for the predominant single-rank access scenario that represents most real-world usage.
3Productivity
If memory modules are tested as single ranks, then testing time and cost are reduced, but testing accuracy for multi-rank operations deteriorates
Solution Approach 1:
The patent applies partial action by testing only the most critical and common single-rank access operations in detail, while accepting that multi-rank operations are tested with reduced precision. This approach is justified because single-rank access represents the majority of real-world memory operations, and the patent provides a practical balance between testing thoroughness and efficiency by focusing resources on the most frequently occurring usage patterns.
Data Source
AI summary
A main board according to example embodiments may include a substrate and at least one socket. The at least one socket may directly connect a memory module to the substrate in a direction parallel to the substrate. A memory mounting test system including the main board may occupy a smaller space, because the memory module is connected to the main board in a direction parallel to the main board.