Parallel Namespace Testing for NVMe SSDs

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Solution Overview

Problem

Conventional testing systems for electronic devices, such as SSDs, are inefficient due to their inability to test multiple namespaces simultaneously, leading to slow overall testing processes.

Innovation Solution

A multiple-name-space testing system that includes a load board, testing electronics, and a namespace testing tracker, allowing for the simultaneous testing of multiple namespaces across multiple devices under test, with the option for accelerated testing using FPGA hardware.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If traditional testing systems test only one namespace at a time per device, then testing complexity is reduced, but testing speed and productivity deteriorate significantly

Engineering Contradiction:
Improvetesting throughputVSAvoidtesting system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The testing system segments the testing process into multiple independent testing channels, each capable of testing a different namespace simultaneously. The load board is divided into multiple testing channels with dedicated testing electronics for each channel, allowing parallel testing of multiple namespaces across multiple devices without increasing overall system complexity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system transitions from sequential testing (one namespace at a time) to parallel testing by adding a spatial dimension - multiple testing channels operating simultaneously. This dimensional expansion allows the system to test multiple namespaces in parallel across multiple devices, dramatically improving productivity while maintaining manageable complexity through modular architecture.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Speed

If multiple namespaces are tested in parallel across multiple devices, then testing speed improves, but tracking and management complexity increases

Engineering Contradiction:
Improvetesting speedVSAvoidtracking and management complexity
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The namespace testing tracker provides real-time feedback on the status of each namespace being tested across all devices. It monitors and records testing progress, results, and any errors encountered, enabling centralized management and coordination of the parallel testing operations. This feedback mechanism simplifies the tracking and management of complex parallel testing by providing visibility and control over all testing activities.

Inventive Principle:
Principle #23Feedback

3Duration of action of moving object

If conventional testing systems are used, then system simplicity is maintained, but overall test time increases significantly

Engineering Contradiction:
Improvetest timeVSAvoidtesting efficiency
Core Design Contradiction:
Duration of action of moving objectVSProductivity

Solution Approach 1:

The system performs preliminary configuration and setup of multiple testing channels and namespaces before actual testing begins. The load board is pre-configured with multiple testing channels, and the namespace testing tracker is prepared to monitor all channels simultaneously. This preliminary preparation enables rapid parallel testing execution, significantly reducing overall test time compared to sequential testing while improving testing efficiency.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12216559B2Systems and methods for parallel testing of multiple namespaces located in a plurality of devices under test
Publication Date: 2025.02.04 MICRON TECHNOLOGY INC
  • US12216559B2 patent drawing
  • US12216559B2 patent drawing
  • US12216559B2 patent drawing

AI summary

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a multiple-name-space testing system comprises a load board, testing electronics, and a namespace testing tracker. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics are configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of multiple-name-spaces across the plurality of DUTs at least in part in parallel. The controller can be coupled to the testing electronics. The namespace testing tracker is configured to track testing of the plurality of DUTs, including the testing of the multiple-name-spaces across the plurality of DUTs at least in part in parallel. In one embodiment, the DUTs are NVMe SSD devices.