Parallel Signal Analysis for Complex Device Testing
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Solution Overview
Problem
Testing complex devices requiring multiple voltages is challenging due to the difficulty in analyzing and identifying the properties of numerous signal waveforms and their relationships, making it hard to ensure proper voltage sequencing and slew rates.
Innovation Solution
A test method and system that acquire and analyze multiple signal sequences in parallel, determining characteristic parameters like slew rate and monotonicity, and storing them for comparison against desired requirements, using multiple probes and analogue-to-digital converters to process and display the data efficiently.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple signal waveforms are displayed on an oscilloscope display, then all voltage signals can be visualized, but it becomes difficult for users to recognize properties and determine compliance
Solution Approach 1:
The patent segments the complex task of waveform analysis by automatically extracting and displaying individual characteristic parameters (slew rate, monotonicity, voltage levels, timing) for each signal. Instead of presenting raw waveforms, the system divides the information into discrete, easily comparable parameter tables that highlight compliance status for each parameter independently.
Solution Approach 2:
The patent introduces an intermediary processing layer between the oscilloscope and the user. This layer automatically measures, analyzes, and extracts characteristic parameters from the raw signals, then presents them in a simplified format. The intermediary system handles the complex analysis work, leaving the user with easily interpretable results.
2Reliability
If all voltage signals are measured and displayed, then complete testing coverage is achieved, but the complexity of analysis increases significantly
Solution Approach 1:
The patent implements self-service by enabling the testing system to automatically perform the complete analysis workflow. The system autonomously acquires signals from multiple probes, determines characteristic parameters, compares them against compliance requirements, and generates pass/fail results without requiring manual analysis. This maintains complete testing coverage while eliminating manual analysis complexity.
Solution Approach 2:
The patent transforms the complex waveform data into simplified parameter representations. By converting continuous waveforms into discrete characteristic parameters (slew rate values, voltage levels, timing measurements), the system maintains comprehensive testing coverage while reducing the complexity of data interpretation and analysis.
3Measurement precision
If characteristic parameters are manually determined from waveforms, then accuracy can be verified, but the testing process becomes time-consuming
Solution Approach 1:
The patent applies preliminary action by pre-configuring compliance requirements and measurement settings before signal acquisition. The system is prepared with all necessary analysis parameters and comparison criteria in advance, enabling rapid automated processing of signals without requiring manual intervention during the actual measurement and analysis phase.
Solution Approach 2:
The patent replaces manual mechanical analysis with automated electronic processing. Instead of manually measuring and comparing waveform parameters, the system uses electronic signal processing to automatically determine characteristic parameters and compare them against requirements, maintaining measurement precision while dramatically increasing testing speed and productivity.
Data Source
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AI summary
The present invention provides an improved testing of a complex device under test, in particular a parallel analysis of signals of a device under test. Multiple signals of the device under test may be acquired and characteristic parameters of the acquired signals may be determined. The determined characteristic parameters of the multiple signals may be stored. In particular, the characteristic parameters may be stored in form of an array, table or spread sheet.