Parallel Semiconductor Switch Fault Detection in Static Operation
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Solution Overview
Problem
Existing methods for monitoring the switching capability of semiconductor switches in power electronic circuits are not reliable for identifying faults in static operation, particularly in high-functional safety applications.
Innovation Solution
A system comprising a first acquisition component, a second acquisition component, and a determination unit that acquires profiles of electrical variables from two semiconductor switches connected in parallel and generates an output signal to identify a non-switching semiconductor switch without requiring the switches to be switched off.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a second power semiconductor is connected in series with the first power semiconductor to ensure switching reliability, then the functional safety and reliability are improved, but the costs, space requirement, and power loss increase
Solution Approach 1:
The patent replaces the mechanical/physical approach of adding series-connected power semiconductors with an electrical monitoring approach. The determination unit electrically monitors the switching state by detecting voltage profiles across the parallel-connected power semiconductor components, substituting physical redundancy with electrical diagnostics to identify non-switching components without adding series connections.
2Difficulty of detecting and measuring
If existing monitoring methods are used to detect switching faults, then the detection capability is provided, but the system cannot diagnose faults in static operation
Solution Approach 1:
The patent changes the monitoring parameter from dynamic switching events to static voltage profile analysis. By measuring and comparing voltage profiles across parallel-connected power semiconductor components even in static operation, the system can diagnose faults without requiring the component to be actively switching, thus extending detection capability to all operational states.
3Reliability
If parallel connection of power semiconductor components is used, then the reliability through redundancy is improved, but the ability to identify faulty components deteriorates
Solution Approach 1:
The patent introduces voltage measurement points and a determination unit as intermediaries between the parallel-connected power semiconductor components and the control system. These intermediaries enable the indirect observation and comparison of the switching state of each component through voltage profile analysis, making fault identification possible without directly interfering with the parallel connection architecture.
Data Source
AI summary
A system and a method for identifying a non-switching semiconductor switch are proposed. The system has a first acquisition component, a second acquisition component and a determination unit. The first acquisition component is designed to acquire a profile of an electrical variable of a first semiconductor switch driven by way of a first drive signal. The second acquisition component is designed to acquire a profile of an electrical variable of a second semiconductor switch driven by way of a second drive signal and connected in parallel with the first semiconductor switch. The determination unit is designed to use the profile of the electrical variable of the first semiconductor switch and the profile of the electrical variable of the second semiconductor switch as a basis for determining an output signal that allows identification of a non-switching semiconductor switch for the first semiconductor switch and/or the second semiconductor switch.