Parallel Tester Array for Display Panel Substrate Testing

The patent divides the testing process into two separate testing workflows: one dedicated to electrical stress testing and another dedicated to power-on testing. Each workflow has its own tester that operates independently and simultaneously, eliminating the sequential execution bottleneck. This segmentation allows parallel processing of different test types, directly resolving the contradiction between operational simplicity and testing efficiency.

The patent merges multiple testers into a single integrated testing system that shares common infrastructure components such as the substrate holder, testing interface, and control unit. While the system uses multiple testers for parallel testing, the shared components maintain structural simplicity. This merging approach allows simultaneous electrical stress testing and power-on testing without proportionally increasing overall system complexity, thus resolving the contradiction between device simplicity and testing speed.

The patent implements continuous testing operations by having multiple testers work in parallel without idle time. While one tester is performing electrical stress testing on a substrate, another tester simultaneously performs power-on testing on a different substrate. This continuous utilization of all testers eliminates wasted time and resources, directly addressing the contradiction between simple resource allocation and efficient tester utilization.