Parallel Automated Waveform Analysis for Mixed Signal Testing
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Solution Overview
Problem
Traditional automated test systems rely on a top-down serial approach that is time-consuming and prone to intermittency issues due to mechanical switching, making it inefficient for testing electronic assemblies, especially when OEM data is lacking or obsolete, and unable to handle legacy systems effectively.
Innovation Solution
A mixed signal parallel functional testing methodology using high-speed analog-to-digital conversion (ADC) channels and automated waveform analysis algorithms to eliminate mechanical switching, allowing simultaneous signal capture and analysis, and employing a 'golden' UUT to establish an operating characteristic response baseline, with automated fault insertion and analysis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional top-down serial testing approach is used, then comprehensive test coverage can be achieved, but test execution time becomes excessively long and mechanical switching causes intermittency issues
Solution Approach 1:
The patent segments the test execution into parallel processes by dividing the test program set into multiple independent test cases that can be executed simultaneously across multiple processing channels, transforming a serial execution model into a parallel architecture that reduces overall test time while maintaining comprehensive coverage
Solution Approach 2:
The patent replaces mechanical switching elements with electronic signal routing and digital processing mechanisms, eliminating the physical switches that cause intermittency and degradation, thereby improving measurement reliability through solid-state or software-based signal management
2Adaptability or versatility
If mechanical switching elements are used to route signals, then signal routing flexibility is achieved, but switching elements degrade over time causing operational intermittency and higher insertion loss
Solution Approach 1:
The patent substitutes mechanical switching elements with electronic or software-based routing mechanisms, replacing physical switches with digital signal processing and electronic switching matrices that do not suffer from mechanical wear, thereby eliminating operational intermittency and insertion loss while preserving routing flexibility
Solution Approach 2:
The patent implements a universal signal routing architecture using software-defined switching that can dynamically configure signal paths without physical reconfiguration, allowing a single system to handle multiple routing scenarios without degrading components, thus maintaining both flexibility and reliability
3Adaptability or versatility
If mass terminated patch panel is used to connect signals, then broad range of electronics assemblies can be tested, but the system becomes large, expensive, and unsuited for smaller assemblies
Solution Approach 1:
The patent implements a universal test platform with programmable signal generation and analysis capabilities that can be configured through software to test different types and sizes of electronic assemblies, replacing the need for dedicated hardware configurations for each assembly type, thereby reducing system size and cost while maintaining broad adaptability
Solution Approach 2:
The patent utilizes programmable parameters in signal generation, switching, and analysis instruments to adapt the test system to different assembly configurations without physical reconfiguration, allowing the same hardware platform to efficiently test everything from small consumer electronics to large aerospace systems through software-defined parameter adjustments
4Reliability
If traditional serial test program set development is used, then thorough testing can be performed, but development time takes months or even years
Solution Approach 1:
The patent segments the test program set development into modular, reusable test cases and templates that can be independently developed and validated, then composed through configuration rather than sequential coding, dramatically reducing development time while maintaining thoroughness through systematic coverage of test scenarios
Solution Approach 2:
The patent implements preliminary action by pre-developing standardized test templates, signal patterns, and analysis algorithms that can be directly applied to new test requirements, eliminating the need to build test programs from scratch and reducing development time from months to days or hours while maintaining comprehensive test coverage
Data Source
AI summary
A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.