Parallel Waveform Analysis for Automated Test Systems
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Traditional automated test systems face inefficiencies due to mechanical switching degradation, high costs, and complexity in testing electronic assemblies, especially when OEM data is lacking or obsolete, leading to increased test program set development time and reduced ability to test legacy assemblies.
Innovation Solution
A mixed signal parallel functional testing approach using high-speed analog-to-digital conversion channels and automated waveform analysis algorithms, eliminating mechanical switching and leveraging a 'known good' unit-under-test to establish an operating characteristic baseline, allowing for simultaneous signal capture and analysis, and automated fault insertion and diagnosis.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional mechanical switching is used to route signals in automated test systems, then signal routing capability is achieved, but switching elements degrade over time resulting in operational intermittency, higher insertion loss and lower isolation
Solution Approach 1:
The patent replaces mechanical switching elements with electronic signal routing through a mass-terminated patch panel and direct connections. Instead of using mechanical switches to route signals between test equipment and units under test, the system uses a fixed patch panel infrastructure where signals are routed electronically through standardized connectors, eliminating the mechanical moving parts that degrade over time.
2Adaptability or versatility
If a mass terminated patch panel with mechanical switching is used to connect 1000 or more signals, then broad range electronics assembly testing capability is achieved, but the system becomes large, expensive and unsuited for testing smaller assemblies
Solution Approach 1:
The patent segments the testing system into modular components including separate stimulus generators, response analyzers, and a standardized patch panel infrastructure. This allows the system to handle large numbers of signals through organized segmentation of test functions and signal groups, reducing the complexity of any single component while maintaining overall system versatility.
Solution Approach 2:
The patent creates a universal test platform using a mass-terminated patch panel that can accommodate various units under test of different sizes and complexities. The standardized connector infrastructure and modular test equipment allow the same system to test anything from small assemblies to large complex electronics, eliminating the need for specialized test systems for different assembly types.
3Reliability
If traditional top-down serial test program set approach is used, then comprehensive testing coverage is achieved, but test program set development takes months or even years
Solution Approach 1:
The patent performs preliminary actions by pre-configuring the test system with a standardized patch panel infrastructure and pre-developing modular test sequences. The stimulus generators and response analyzers are pre-programmed with standard test patterns, allowing rapid deployment of comprehensive test coverage without requiring months of custom programming for each new unit under test.
Solution Approach 2:
The patent uses copying by replicating standardized test sequences and stimulus patterns across multiple test channels. Instead of manually programming each test sequence from scratch, the system copies and adapts proven test patterns to different units under test, maintaining comprehensive coverage while dramatically reducing development time.
4Productivity
If parallel signal capture using high speed ADC channels is implemented, then test program set runtime is substantially reduced, but the system requires advanced digitizing technology
Solution Approach 1:
The patent replaces traditional sequential measurement methods with parallel digital signal capture using high-speed ADC channels. Instead of measuring signals one at a time through sequential test steps, the system captures multiple signal channels simultaneously in the digital domain, enabling substantial reduction in test runtime while using standardized digitizing technology.
Data Source
AI summary
A mixed signal testing system capable of testing differently configured units under test (UUT) includes a controller, a test station and an interface system that support multiple UUTs. The test station includes independent sets of channels configured to send signals to and receive signals from each UUT being tested and signal processing subsystems that direct stimulus signals to a respective set of channels and receive signals in response thereto. The signal processing subsystems enable simultaneous and independent directing of stimulus signals through the sets of channels to each UUT and reception of signals from each UUT in response to the stimulus signals. Received signals responsive to stimulus signals provided to a fully functional UUT (with and without induced faults) are used to assess presence or absence of faults in the UUT being tested which may be determined to include one or more faults or be fault-free, i.e., fully functional.