Parameter Recording in Electronics Production Lines

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Solution Overview

Problem

Existing electronics production lines face challenges in efficiently recording and evaluating parameter values across various devices, leading to difficulties in optimizing production processes and ensuring quality control.

Innovation Solution

A method and system for recording and evaluating parameter values in electronics production lines, which involves receiving parameter values from devices such as joining material applicators, placement devices, and joining devices, and storing them in datasets associated with component carriers and resulting assemblies. These datasets are then compared with permissible ranges to identify any deviations and facilitate process adjustments.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If parameter values are recorded and evaluated across multiple devices in the electronics production line, then quality control and process optimization are improved, but data management complexity increases

Engineering Contradiction:
Improvequality controlVSAvoiddata management complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent combines parameter values from multiple devices (joining material applicator, placement device, joining device) into a single unified dataset associated with component carriers and assemblies. This merging approach simplifies data management by consolidating scattered data into one structured repository while enabling comprehensive quality control evaluation across the entire production line.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The unified dataset structure serves multiple functions simultaneously: it stores parameter values from different devices, associates them with specific component carriers and assemblies, enables quality control evaluation, and facilitates process optimization. This multi-functional design reduces the need for separate data management systems for each device.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Productivity

If real-time evaluation of parameter values is implemented, then process optimization is improved, but system complexity increases

Engineering Contradiction:
Improveprocess optimization speedVSAvoidsystem complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The system pre-establishes permissible ranges for parameter values before production begins. During real-time operation, the system simply compares recorded parameter values against these pre-defined ranges, enabling quick identification of deviations without complex real-time calculations or decisions.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system implements feedback by comparing recorded parameter values with permissible ranges and identifying deviations. This feedback mechanism enables real-time process optimization by immediately detecting when parameters go out of range, allowing for timely corrections while maintaining relatively simple system architecture.

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If comprehensive parameter recording is implemented across all devices, then manufacturing precision is improved, but data storage requirements increase

Engineering Contradiction:
Improveparameter recording accuracyVSAvoiddata storage requirements
Core Design Contradiction:
Manufacturing precisionVSQuantity of substance

Solution Approach 1:

The patent segments the data storage approach by creating a unified dataset structure that organizes parameter values according to their association with specific component carriers and assemblies. This segmentation enables comprehensive recording of parameters from all devices while improving storage efficiency through structured organization and eliminating redundant data.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250040114A1Recording and Evaluating Parameter Values in an Electronics Production Line
Publication Date: 2025.01.30 SIEMENS AG
  • US20250040114A1 patent drawing
  • US20250040114A1 patent drawing

AI summary

Various embodiments of the teachings herein include methods for recording and evaluating parameter values in an electronics production line to produce electronic assemblies, the production line including a dispenser for applying joining material to a component carrier, a placement device for placing electronic components on the component carrier, and a joining device to join the electronic components to the component carrier. An example method includes: receiving a parameter value from each of the devices; and storing the parameter values in a dataset associated with a defined number of component carrier and with the resulting assemblies.